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2020 IEEE Workshop Celebrating the Scientific Value of Failure : FailFest 2020 : proceedings : virtual event, 25 October 2020 / / IEEE



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Titolo: 2020 IEEE Workshop Celebrating the Scientific Value of Failure : FailFest 2020 : proceedings : virtual event, 25 October 2020 / / IEEE Visualizza cluster
Pubblicazione: Piscataway, New Jersey : , : IEEE, , [2020]
©2020
Descrizione fisica: 1 online resource (11 pages) : illustrations
Disciplina: 158.1
Soggetto topico: Failure (Psychology)
Nota di bibliografia: Includes bibliographical references and index.
Sommario/riassunto: VIS 2020 will be the year s premier forum for advances in theory, methods, and applications of visualization and visual analytics The conference will convene an international community of researchers and practitioners from universities, government, and industry to exchange recent findings on the design and use of visualization tools We invite you to share your research, insights, and enthusiasm at IEEE Visual Analytics Science and Technology (VAST), IEEE Information Visualization (InfoVis), and IEEE Scientific Visualization (SciVis).
Altri titoli varianti: 2020 IEEE Workshop Celebrating the Scientific Value of Failure
Titolo autorizzato: 2020 IEEE Workshop Celebrating the Scientific Value of Failure  Visualizza cluster
ISBN: 1-7281-8556-4
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 996575530003316
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