LEADER 01772nam 2200373 450 001 996575530003316 005 20230414113743.0 010 $a1-7281-8556-4 035 $a(CKB)5590000000430265 035 $a(NjHacI)995590000000430265 035 $a(EXLCZ)995590000000430265 100 $a20230414d2020 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2020 IEEE Workshop Celebrating the Scientific Value of Failure $eFailFest 2020 : proceedings : virtual event, 25 October 2020 /$fIEEE 210 1$aPiscataway, New Jersey :$cIEEE,$d[2020] 210 4$dİ2020 215 $a1 online resource (11 pages) $cillustrations 311 $a1-7281-8557-2 320 $aIncludes bibliographical references and index. 330 $aVIS 2020 will be the year s premier forum for advances in theory, methods, and applications of visualization and visual analytics The conference will convene an international community of researchers and practitioners from universities, government, and industry to exchange recent findings on the design and use of visualization tools We invite you to share your research, insights, and enthusiasm at IEEE Visual Analytics Science and Technology (VAST), IEEE Information Visualization (InfoVis), and IEEE Scientific Visualization (SciVis). 517 $a2020 IEEE Workshop Celebrating the Scientific Value of Failure 606 $aFailure (Psychology)$vCongresses 615 0$aFailure (Psychology) 676 $a158.1 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a996575530003316 996 $a2020 IEEE Workshop Celebrating the Scientific Value of Failure$93089647 997 $aUNISA