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2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009



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Titolo: 2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009 Visualizza cluster
Pubblicazione: [Place of publication not identified], : IEEE Computer Society, 2009
Disciplina: 621.39/5
Soggetto topico: Integrated circuits - Very large scale integration - Testing
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Note generali: Bibliographic Level Mode of Issuance: Monograph
Titolo autorizzato: 2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009  Visualizza cluster
ISBN: 1-5090-7567-4
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 996218375903316
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
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