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Record Nr. |
UNISA996218375903316 |
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Titolo |
2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009 |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE Computer Society, 2009 |
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ISBN |
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Disciplina |
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Soggetti |
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Integrated circuits - Very large scale integration - Testing |
Electrical Engineering |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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