Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 18-21 July 2016, Marina Bay Sand, Singapore / / sponsored by IEEE [and six others]
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| Titolo: |
Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 18-21 July 2016, Marina Bay Sand, Singapore / / sponsored by IEEE [and six others]
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| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2016 |
| Descrizione fisica: | 1 online resource (111 pages) |
| Disciplina: | 629.831 |
| Soggetto topico: | Integrated circuits - Reliability |
| Integrated circuits - Testing | |
| Titolo autorizzato: | Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| ISBN: | 1-4673-8259-0 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910332529303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |