In-situ Materials Characterization : Across Spatial and Temporal Scales / / edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken
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| Titolo: |
In-situ Materials Characterization : Across Spatial and Temporal Scales / / edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken
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| Pubblicazione: | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2014 |
| Edizione: | 1st ed. 2014. |
| Descrizione fisica: | 1 online resource (265 p.) |
| Disciplina: | 620.110287 |
| Soggetto topico: | Nanoscale science |
| Nanoscience | |
| Nanostructures | |
| Materials science | |
| Spectroscopy | |
| Microscopy | |
| Materials—Surfaces | |
| Thin films | |
| Nanotechnology | |
| Structural materials | |
| Nanoscale Science and Technology | |
| Characterization and Evaluation of Materials | |
| Spectroscopy and Microscopy | |
| Surfaces and Interfaces, Thin Films | |
| Structural Materials | |
| Persona (resp. second.): | ZieglerAlexander |
| GraafsmaHeinz | |
| ZhangXiao Feng | |
| FrenkenJoost W.M | |
| Note generali: | Description based upon print version of record. |
| Nota di bibliografia: | Includes bibliographical references and index. |
| Nota di contenuto: | Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization. |
| Sommario/riassunto: | The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction. |
| Titolo autorizzato: | In-situ Materials Characterization |
| ISBN: | 3-642-45152-7 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910300372703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
Springer Series in Materials Science, . 0933-033X ; ; 193