LEADER 05549nam 22009495 450 001 9910300372703321 005 20200702002719.0 010 $a3-642-45152-7 024 7 $a10.1007/978-3-642-45152-2 035 $a(CKB)2560000000148728 035 $a(EBL)1697982 035 $a(OCoLC)881166001 035 $a(SSID)ssj0001204942 035 $a(PQKBManifestationID)11962953 035 $a(PQKBTitleCode)TC0001204942 035 $a(PQKBWorkID)11181047 035 $a(PQKB)11143785 035 $a(MiAaPQ)EBC1697982 035 $a(DE-He213)978-3-642-45152-2 035 $a(PPN)178320781 035 $a(EXLCZ)992560000000148728 100 $a20140401d2014 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aIn-situ Materials Characterization $eAcross Spatial and Temporal Scales /$fedited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken 205 $a1st ed. 2014. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d2014. 215 $a1 online resource (265 p.) 225 1 $aSpringer Series in Materials Science,$x0933-033X ;$v193 300 $aDescription based upon print version of record. 311 $a3-642-45151-9 320 $aIncludes bibliographical references and index. 327 $aScanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- ?Real-time? probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization. 330 $aThe behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction. 410 0$aSpringer Series in Materials Science,$x0933-033X ;$v193 606 $aNanoscale science 606 $aNanoscience 606 $aNanostructures 606 $aMaterials science 606 $aSpectroscopy 606 $aMicroscopy 606 $aMaterials?Surfaces 606 $aThin films 606 $aNanotechnology 606 $aStructural materials 606 $aNanoscale Science and Technology$3https://scigraph.springernature.com/ontologies/product-market-codes/P25140 606 $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 606 $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000 606 $aNanotechnology$3https://scigraph.springernature.com/ontologies/product-market-codes/Z14000 606 $aStructural Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z11000 615 0$aNanoscale science. 615 0$aNanoscience. 615 0$aNanostructures. 615 0$aMaterials science. 615 0$aSpectroscopy. 615 0$aMicroscopy. 615 0$aMaterials?Surfaces. 615 0$aThin films. 615 0$aNanotechnology. 615 0$aStructural materials. 615 14$aNanoscale Science and Technology. 615 24$aCharacterization and Evaluation of Materials. 615 24$aSpectroscopy and Microscopy. 615 24$aSurfaces and Interfaces, Thin Films. 615 24$aNanotechnology. 615 24$aStructural Materials. 676 $a620.110287 702 $aZiegler$b Alexander$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aGraafsma$b Heinz$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aZhang$b Xiao Feng$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aFrenken$b Joost W.M$4edt$4http://id.loc.gov/vocabulary/relators/edt 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910300372703321 996 $aIn-situ Materials Characterization$91770876 997 $aUNINA