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2013 8th IEEE Design and Test Symposium / / Institute of Electrical and Electronics Engineers



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Titolo: 2013 8th IEEE Design and Test Symposium / / Institute of Electrical and Electronics Engineers Visualizza cluster
Pubblicazione: Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2013
Descrizione fisica: 1 online resource : illustrations
Disciplina: 621
Soggetto topico: Electronic circuit design
Integrated circuits - Testing
Electronic circuits - Testing
Sommario/riassunto: The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region.
Altri titoli varianti: Design and Test Symposium
Titolo autorizzato: 2013 8th IEEE Design and Test Symposium  Visualizza cluster
ISBN: 1-4799-3525-5
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 996279298903316
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