LEADER 01034nam0-22003011i-450- 001 990000102650403321 035 $a000010265 035 $aFED01000010265 035 $a(Aleph)000010265FED01 035 $a000010265 100 $a20011111d--------km-y0itay50------ba 101 0 $aita 105 $ay-------001yy 200 1 $aHigher education$ereport for the school year ending July 31, 1918 by Augustus S. Downing$evol. 3. of the sixteenth annualreport of the State department of education. 210 $aAlbany$cThe university of the state of New York$d1922 215 $a324 p.$d23 cm 300 $aIn testa al front.: The University of the state of New York. The state Department of education 676 $a378 702 1$aDowning,$bAugustus S. 710 02$aUniversity of the State of New York$0333023 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990000102650403321 952 $a13 K 21 25$b5151$fFINBC 959 $aFINBC 996 $aHigher education$9116166 997 $aUNINA DB $aING01 LEADER 01735nam 2200397 450 001 996279298903316 005 20230424180829.0 010 $a1-4799-3525-5 035 $a(CKB)3460000000126181 035 $a(NjHacI)993460000000126181 035 $a(EXLCZ)993460000000126181 100 $a20230424d2013 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2013 8th IEEE Design and Test Symposium /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers (IEEE),$d2013. 215 $a1 online resource $cillustrations 311 $a1-4799-3526-3 330 $aThe International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region. 517 $aDesign and Test Symposium 606 $aElectronic circuit design$vCongresses 606 $aIntegrated circuits$xTesting$vCongresses 606 $aElectronic circuits$xTesting$vCongresses 615 0$aElectronic circuit design 615 0$aIntegrated circuits$xTesting 615 0$aElectronic circuits$xTesting 676 $a621 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a996279298903316 996 $a2013 8th IEEE Design and Test Symposium$92544567 997 $aUNISA