VLSI Test Symposium (VTS 2000): 18th IEEE

• Pubblicazione: [Place of publication not identified], : IEEE Computer Society Press, 2000
• Descrizione fisica: 1 online resource (478 pages) : illustrations
• Disciplina: 621.3950287
• Soggetto topico: Integrated circuits - Very large scale integration - Testing
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Foreword -- Organizing Committee -- Steering Committe -- Program Committee -- Reviewers -- VTS '99 Best Paper Award -- VTS '99 Best Panel Award -- Test Technology Technical Council -- Test Technology Education Program: Overview Tutorials -- Plenary Session -- Welcome Message -- Adit Singh -- Keynote Address: "Optical Internet: Industry Challenge" -- Brian McFadden -- Program Introduction -- Joan Figueras -- Invited Presentation: "Wall Street Perspective on System-on-Chip and Test Technology" -- Erach D. Desai.
• Sommario/riassunto: Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
• Titolo autorizzato: VLSI Test Symposium (VTS 2000): 18th IEEE
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 996218755803316
• Lo trovi qui: Univ. di Salerno