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101 0 $aeng
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181   $ctxt
182   $cc
183   $acr
200 10$aVLSI Test Symposium (VTS 2000): 18th IEEE
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2000
215   $a1 online resource (478 pages) $cillustrations
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-0613-5 
320   $aIncludes bibliographical references and index.
327   $aForeword -- Organizing Committee -- Steering Committe -- Program Committee -- Reviewers -- VTS '99 Best Paper Award -- VTS '99 Best Panel Award -- Test Technology Technical Council -- Test Technology Education Program: Overview Tutorials -- Plenary Session -- Welcome Message -- Adit Singh -- Keynote Address: "Optical Internet: Industry Challenge" -- Brian McFadden -- Program Introduction -- Joan Figueras -- Invited Presentation: "Wall Street Perspective on System-on-Chip and Test Technology" -- Erach D. Desai.
330   $aProceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
606   $aIntegrated circuits$xVery large scale integration$xTesting
615  0$aIntegrated circuits$xVery large scale integration$xTesting.
676   $a621.3950287
801  0$bPQKB
906   $aPROCEEDING
912   $a996218755803316
996   $aVLSI Test Symposium (VTS 2000): 18th IEEE$92355417
997   $aUNISA