1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
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| Titolo: |
1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
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| Pubblicazione: | [Place of publication not identified], : IEEE Electron Devices Society, 1996 |
| Disciplina: | 621.3815 |
| Soggetto topico: | Integrated circuits - Reliability |
| Integrated circuits - Reliability - Wafer scale integration - Congresses | |
| Electrical & Computer Engineering | |
| Electrical Engineering | |
| Engineering & Applied Sciences | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | 1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910872781003321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |