01838oam 2200481zu 450 991087278100332120241212214844.0(CKB)111026746712728(SSID)ssj0000455345(PQKBManifestationID)12148334(PQKBTitleCode)TC0000455345(PQKBWorkID)10399475(PQKB)11015469(EXLCZ)9911102674671272820160829d1996 uy engtxtccr1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995[Place of publication not identified]IEEE Electron Devices Society1996Bibliographic Level Mode of Issuance: Monograph9780780327054 0780327055 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer scale integrationCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer scale integrationCongresses.Electrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.3815IEEE Electron Devices SocietyIEEE Reliability SocietyInternational Integrated Reliability WorkshopPQKBBOOK99108727810033211995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 19952531430UNINA