Vai al contenuto principale della pagina

IEEE Std 1005-1991 : IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays / / Institute of Electrical and Electronics Engineers



(Visualizza in formato marc)    (Visualizza in BIBFRAME)

Titolo: IEEE Std 1005-1991 : IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays / / Institute of Electrical and Electronics Engineers Visualizza cluster
Pubblicazione: New York, NY, USA : , : IEEE, , 1991
Descrizione fisica: 1 online resource (41 pages)
Disciplina: 621.3973
Soggetto topico: Integrated circuits - Very large scale integration - Testing
Semiconductor storage devices
Sommario/riassunto: An introduction to the physics unique to this type of memory and an overview of typical array architectures are presented. The variations on the basic floating gate nonvolatile cell structure that have been used in commercially available devices are described. The various reliability considerations involved in these devices are explored. Retention and endurance failures and the interaction between endurance, retention, and standard semiconductor failure mechanisms in determining the device failure rate are covered. How to specify and perform engineering verification of retention of data stored in the arrays is described. Effects that limit the endurance of the arrays are discussed. The specification and engineering verification of endurance are described. The more common features incorporated into the arrays and methods for testing these complex products efficiently are addressed. The effects that various forms of ionizing radiation may have on floating gate arrays and approaches to test for these effects are covered. The use of floating gate cells in nonmemory applications is briefly considered.
Altri titoli varianti: IEEE Std 1005-1991
Titolo autorizzato: IEEE Std 1005-1991  Visualizza cluster
ISBN: 1-55937-136-6
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 996280849703316
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui