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Titolo: |
Defects and diffusion in semiconductors . XI : an annual retrospective / / D.J. Fisher
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Pubblicazione: | Stafa-Zuerich, Switzerland : , : TTP, Trans Tech Publications, , [2008] |
©2008 | |
Edizione: | 1st ed. |
Descrizione fisica: | 1 online resource (160 p.) |
Soggetto topico: | Semiconductors - Defects |
Semiconductors - Diffusion | |
Altri autori: |
FisherD. J
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Note generali: | Description based upon print version of record. |
Nota di bibliografia: | Includes bibliographical references and indexes. |
Nota di contenuto: | Defects and Diffusion in Semicondutors, 2009; Table of Contents; Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites; Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon; Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys; Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br); Abstracts; Keywords Index; Authors Index |
Sommario/riassunto: | This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: ""Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites"" (H.Abdullah and S.A.Halim), ""Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon"" (M.N.Mungole, M.Surender, R.Balasubram |
Titolo autorizzato: | Defects and diffusion in semiconductors ![]() |
ISBN: | 3-03813-208-X |
Formato: | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910822485203321 |
Lo trovi qui: | Univ. Federico II |
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