6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
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| Titolo: |
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
|
| Pubblicazione: | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina: | 621.39/5 |
| Soggetto topico: | Integrated circuits - Reliability - Very large scale integration |
| Integrated circuits - Very large scale integration - Design and construction | |
| Integrated circuits - Very large scale integration - Computer-aided design | |
| Integrated circuits - Very large scale integration - Testing - Quality control | |
| Electrical & Computer Engineering | |
| Engineering & Applied Sciences | |
| Electrical Engineering | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| ISBN: | 1-5386-0067-6 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910146498103321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |