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101 0 $aeng
181   $ctxt
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183   $acr
200 10$a6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2005
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2301-3 
606   $aIntegrated circuits$xReliability$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xComputer-aided design$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xTesting$xQuality control$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xReliability$xVery large scale integration
615  0$aIntegrated circuits$xVery large scale integration$xDesign and construction
615  0$aIntegrated circuits$xVery large scale integration$xComputer-aided design
615  0$aIntegrated circuits$xVery large scale integration$xTesting$xQuality control
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.39/5
712 02$aIEEE Electron Devices Society
712 12$aInternational Symposium on Quality Electronic Design
801  0$bPQKB
906   $aPROCEEDING
912   $a9910146498103321
996   $a6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California$92406094
997   $aUNINA