Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / / edited by Danuta Stróż and Krystian Prusik

• Pubblicazione: Durnten-Zurich, Switzerland ; ; Enfield, NH, USA : , : TTP, , [2012]; ©2012
• Descrizione fisica: 1 online resource (352 p.)
• Disciplina: 502.825
• Soggetto topico: Electron microscopy
• Soggetto non controllato: Electron microscopy
• Altri autori: StróżDanuta PrusikKrystian
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and indexes.
• Nota di contenuto: Electron Microscopy XIV; Preface and Conference Photo; Table of Contents; Methods of Electron Crystallography as Tools for Materials Analysis; Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films; Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science; The Art and Application of Large Angle Convergent Beam Electron Diffraction; Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM; Secondary Electron Detector with the Unipotential Lens Structure for Variable Pressure/Environmental SEM ; A Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food SupplementsPhysical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy; 3D Imaging and Metrology of Yttria Dispersoids in INCOLOY MA956 by Electron Tomography; 3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography; Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron Tomography ; Martensitic Transformation in Ti50Ni25Cu25 Shape Memory Alloy Studied by EBSDInvestigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope; Phase Identification in Nickel-Based Superalloys Using EBSD/SEM and Electron Diffraction in STEM; High Resolution EBSD/SEM Analysis of PLZT Ferroelectric Crystals in Low Vacuum Conditions - A few Practical Remarks; Study of Silicon Nanoparticles Formation in Silicon Nitride; Structural and Chemical Characterization of Al(Ga)N/GaN Quantum Well Structures Grown by Plasma Assisted Molecular Beam Epitaxy ; Wurtzite-to Amorphous-to Cubic Phase Transition of GaN1-XAsx Alloys with Increasing as ContentStudy of Oxides Formed in HfO2/Si Structure for High-k Dielectric Applications; Ni-Based Ohmic Contacts to Silicon Carbide Examined by Electron Microscopy; Crystallization and Microstructure of Co0.75Ni0.25Si2 Solid Solution; Nanotexture Studies of NiTi Shape Memory Alloy after Severe Plastic Deformation with the Use of TEM; SEM EBSD and TEM Structure Studies of α-Brass after Severe Plastic Deformation Using Equal Channel Rolling Followed by Groove Pressing ; Crystallographic Aspects of Deformation and Recrystallization in ECAP-Processed AA3104 Aluminium AlloyMicrostructure of the Ni-W Solid Solution Prepared by Levitation and after High Pressure Torsion Severe Plastic Deformation; Near Grain Boundary Behavior of Aluminum Bicrystals Deformed in Plane Strain Conditions; Microstructure and Texture Evolutions in AA1200 Aluminum Alloy Deformed by Accumulative Roll Bonding Method; Gradient Microstructure of FeCr30Co8 Hard Magnetic Alloy Subjected to Plastic Deformation by Tension Combined with Torsion at 700 and 720°C ; Effect of Rapid Solidification on the Structure and Mechanical Properties of AZ91 Magnesium Alloy
• Sommario/riassunto: These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisla, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and i
• Titolo autorizzato: Electron microscopy XIV
• ISBN: 3-03813-699-9
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910824189103321
• Lo trovi qui: Univ. Federico II
• Serie: Diffusion and defect data. : Pt. B, . -Solid state phenomena ; ; volumes 186.