LEADER 05576nam 2200637 450 001 9910824189103321 005 20230801225940.0 010 $a3-03813-699-9 035 $a(CKB)2670000000314549 035 $a(EBL)1872826 035 $a(SSID)ssj0000849573 035 $a(PQKBManifestationID)11443868 035 $a(PQKBTitleCode)TC0000849573 035 $a(PQKBWorkID)10812683 035 $a(PQKB)11627154 035 $a(Au-PeEL)EBL1872826 035 $a(CaPaEBR)ebr10828215 035 $a(OCoLC)872671166 035 $a(MiAaPQ)EBC1872826 035 $a(EXLCZ)992670000000314549 100 $a20130219h20122012 uy| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aElectron microscopy XIV $eselected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland /$fedited by Danuta Stro?z? and Krystian Prusik 210 1$aDurnten-Zurich, Switzerland ;$aEnfield, NH, USA :$cTTP,$d[2012] 210 4$d©2012 215 $a1 online resource (352 p.) 225 1 $aSolid state phenomena,$x1012-0394 ;$vvolumes 186 300 $aDescription based upon print version of record. 311 $a3-03785-381-6 320 $aIncludes bibliographical references and indexes. 327 $aElectron Microscopy XIV; Preface and Conference Photo; Table of Contents; Methods of Electron Crystallography as Tools for Materials Analysis; Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films; Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science; The Art and Application of Large Angle Convergent Beam Electron Diffraction; Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM; Secondary Electron Detector with the Unipotential Lens Structure for Variable Pressure/Environmental SEM 327 $aA Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food SupplementsPhysical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy; 3D Imaging and Metrology of Yttria Dispersoids in INCOLOY MA956 by Electron Tomography; 3D Imaging of Strengthening Particles in Cr-V-Mo (13HMF) Steel Using FIB/SEM Tomography; Three-Dimensional Visualization and Metrology of Nanoparticles in Inconel 718 by Electron Tomography 327 $aMartensitic Transformation in Ti50Ni25Cu25 Shape Memory Alloy Studied by EBSDInvestigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope; Phase Identification in Nickel-Based Superalloys Using EBSD/SEM and Electron Diffraction in STEM; High Resolution EBSD/SEM Analysis of PLZT Ferroelectric Crystals in Low Vacuum Conditions - A few Practical Remarks; Study of Silicon Nanoparticles Formation in Silicon Nitride; Structural and Chemical Characterization of Al(Ga)N/GaN Quantum Well Structures Grown by Plasma Assisted Molecular Beam Epitaxy 327 $aWurtzite-to Amorphous-to Cubic Phase Transition of GaN1-XAsx Alloys with Increasing as ContentStudy of Oxides Formed in HfO2/Si Structure for High-k Dielectric Applications; Ni-Based Ohmic Contacts to Silicon Carbide Examined by Electron Microscopy; Crystallization and Microstructure of Co0.75Ni0.25Si2 Solid Solution; Nanotexture Studies of NiTi Shape Memory Alloy after Severe Plastic Deformation with the Use of TEM; SEM EBSD and TEM Structure Studies of ?-Brass after Severe Plastic Deformation Using Equal Channel Rolling Followed by Groove Pressing 327 $aCrystallographic Aspects of Deformation and Recrystallization in ECAP-Processed AA3104 Aluminium AlloyMicrostructure of the Ni-W Solid Solution Prepared by Levitation and after High Pressure Torsion Severe Plastic Deformation; Near Grain Boundary Behavior of Aluminum Bicrystals Deformed in Plane Strain Conditions; Microstructure and Texture Evolutions in AA1200 Aluminum Alloy Deformed by Accumulative Roll Bonding Method; Gradient Microstructure of FeCr30Co8 Hard Magnetic Alloy Subjected to Plastic Deformation by Tension Combined with Torsion at 700 and 720°C 327 $aEffect of Rapid Solidification on the Structure and Mechanical Properties of AZ91 Magnesium Alloy 330 $aThese are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisla, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and i 410 0$aDiffusion and defect data.$nPt. B,$pSolid state phenomena ;$vvolumes 186. 606 $aElectron microscopy$vCongresses 610 1 $aElectron microscopy 615 0$aElectron microscopy 676 $a502.825 701 $aStro?z?$b Danuta$01650612 701 $aPrusik$b Krystian$01650613 712 12$aInternational Conference on Electron Microscopy 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910824189103321 996 $aElectron microscopy XIV$94000063 997 $aUNINA