IPFA : proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore / / organised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability Society
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| Titolo: |
IPFA : proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore / / organised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability Society
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| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 |
| Descrizione fisica: | 1 online resource (291 pages) |
| Disciplina: | 621.3815 |
| Soggetto topico: | Integrated circuits - Reliability |
| Integrated circuits - Testing | |
| Semiconductors - Failures | |
| Integrated circuits - Defects | |
| Titolo autorizzato: | IPFA |
| ISBN: | 1-4799-3929-3 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910141899703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |