IPFA : proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore / / organised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability Society

• Record Nr.: UNINA9910141899703321
• Pubbl/distr/stampa: Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014
• ISBN: 1-4799-3929-3
• Descrizione fisica: 1 online resource (291 pages)
• Disciplina: 621.3815
• Soggetti: Integrated circuits - Reliability; Integrated circuits - Testing; Semiconductors - Failures; Integrated circuits - Defects
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia