DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
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| Titolo: |
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
|
| Pubblicazione: | [Place of publication not identified], : IEEE, 2004 |
| Disciplina: | 621.39/732 |
| Soggetto topico: | Metal oxide semiconductors, Complementary - Defects |
| Integrated circuits | |
| Iddq testing | |
| Electrical & Computer Engineering | |
| Electrical Engineering | |
| Engineering & Applied Sciences | |
| Persona (resp. second.): | MenonSankaran M |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 996204076503316 |
| Lo trovi qui: | Univ. di Salerno |
| Opac: | Controlla la disponibilità qui |