01893oam 2200493zu 450 99620407650331620210806235815.0(CKB)1000000000022552(SSID)ssj0000394124(PQKBManifestationID)12120541(PQKBTitleCode)TC0000394124(PQKBWorkID)10378757(PQKB)10695507(EXLCZ)99100000000002255220160829d2004 uy engtxtccrDBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA[Place of publication not identified]IEEE2004Bibliographic Level Mode of Issuance: Monograph0-7803-8950-6 Metal oxide semiconductors, ComplementaryDefectsCongressesIntegrated circuitsCongressesIddq testingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCMetal oxide semiconductors, ComplementaryDefectsIntegrated circuitsIddq testingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.39/732Menon Sankaran MIEEE Computer Society Test Technology Technical CommitteeIEEE International Workshop on Defect Based TestingPQKBPROCEEDING996204076503316DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA2324854UNISA00932nam a2200241 i 450099100084398970753620020507102215.0951030s1976 it ||| | ita b1013749x-39ule_instLE00637820ExLDip.to Fisicaita912Regione Emilia Romagna40146Carta tecnica regionale :[Emilia Romagna] /a cura della Regione Emilia-RomagnaBologna :[s.n.],197670 p. :ill. ;30 cm.Formazione della C.T.R. Capitolatospeciale d'appalto. Norme per il disegno e segni convenzionali..b1013749x21-09-0627-06-02991000843989707536LE006 912 REG12006000050098le006-E0.00-l- 00000.i1016248327-06-02Carta tecnica regionale185583UNISALENTOle00601-01-95ma -itait 01