2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
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| Titolo: |
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
|
| Pubblicazione: | [Place of publication not identified], : IEEE Computer Society, 2000 |
| Disciplina: | 621.3815 |
| Soggetto topico: | Integrated circuits - Defects |
| Iddq testing | |
| Metal oxide semiconductors, Complementary | |
| Electrical & Computer Engineering | |
| Electrical Engineering | |
| Engineering & Applied Sciences | |
| Persona (resp. second.): | MenonSankaran M |
| SachdevManoj | |
| MalaiyaYashwant K | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | 2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910872792503321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |