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Record Nr. |
UNINA9910872792503321 |
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Titolo |
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE Computer Society, 2000 |
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Disciplina |
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Soggetti |
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Integrated circuits - Defects |
Iddq testing |
Metal oxide semiconductors, Complementary |
Electrical & Computer Engineering |
Electrical Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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