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In-situ Materials Characterization : Across Spatial and Temporal Scales / / edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken



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Titolo: In-situ Materials Characterization : Across Spatial and Temporal Scales / / edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken Visualizza cluster
Pubblicazione: Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2014
Edizione: 1st ed. 2014.
Descrizione fisica: 1 online resource (265 p.)
Disciplina: 620.110287
Soggetto topico: Nanoscale science
Nanoscience
Nanostructures
Materials science
Spectroscopy
Microscopy
Materials—Surfaces
Thin films
Nanotechnology
Structural materials
Nanoscale Science and Technology
Characterization and Evaluation of Materials
Spectroscopy and Microscopy
Surfaces and Interfaces, Thin Films
Structural Materials
Persona (resp. second.): ZieglerAlexander
GraafsmaHeinz
ZhangXiao Feng
FrenkenJoost W.M
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.
Sommario/riassunto: The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.
Titolo autorizzato: In-situ Materials Characterization  Visualizza cluster
ISBN: 3-642-45152-7
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910300372703321
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Serie: Springer Series in Materials Science, . 0933-033X ; ; 193