7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
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| Titolo: |
7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
|
| Pubblicazione: | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina: | 621.3815 |
| Soggetto topico: | Integrated circuits - Reliability - Very large scale integration |
| Integrated circuits - Very large scale integration - Design and construction | |
| Integrated circuits - Computer-aided design - Very large scale integration | |
| Integrated circuits - Testing - Quality control - Very large scale integration | |
| Electrical & Computer Engineering | |
| Engineering & Applied Sciences | |
| Electrical Engineering | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Altri titoli varianti: | ISQED '06 |
| Titolo autorizzato: | 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| ISBN: | 9781509094592 |
| 1509094598 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910145452103321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |