LEADER 02565oam  2200601zu 450 
001 9910145452103321
005 20241212215417.0
010   $a9781509094592
010   $a1509094598
035   $a(CKB)1000000000278069
035   $a(SSID)ssj0000395947
035   $a(PQKBManifestationID)12111753
035   $a(PQKBTitleCode)TC0000395947
035   $a(PQKBWorkID)10459122
035   $a(PQKB)10667513
035   $a(Association for Computing Machinery)10.5555/1126255
035   $a(EXLCZ)991000000000278069
100   $a20160829d2006      uy 
101 0 $aeng
135   $aurnn#008mam|a
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
210 31$a[Place of publication not identified] :$cIEEE Computer Society,$d2006.
225 0 $aACM Conferences.
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780769525235 
311 08$a0769525237 
517 3 $aISQED '06
606   $aIntegrated circuits$xReliability$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
606   $aIntegrated circuits$xComputer-aided design$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xTesting$xQuality control$xVery large scale integration$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xReliability$xVery large scale integration
615  0$aIntegrated circuits$xVery large scale integration$xDesign and construction
615  0$aIntegrated circuits$xComputer-aided design$xVery large scale integration
615  0$aIntegrated circuits$xTesting$xQuality control$xVery large scale integration
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815
712 02$aIEEE Electron Devices Society,
712 02$aComponents, Packaging & Manufacturing Technology Society,
712 02$aIEEE Circuits and Systems Society,
801  0$bPQKB
906   $aPROCEEDING
912   $a9910145452103321
996   $a7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California$91924931
997   $aUNINA