Test Conference (ITC), 2015 IEEE International / / Institute of Electrical and Electronics Engineers
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| Titolo: |
Test Conference (ITC), 2015 IEEE International / / Institute of Electrical and Electronics Engineers
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| Pubblicazione: | Piscataway, NJ : , : IEEE, , 2015 |
| Descrizione fisica: | 1 online resource (various pagings) : illustrations |
| Disciplina: | 005.14 |
| Soggetto topico: | Computer software - Testing |
| Sommario/riassunto: | International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. |
| Altri titoli varianti: | 2015 IEEE International Test Conference |
| 2015 IEEE International Test Conference (ITC) | |
| Test Conference | |
| Titolo autorizzato: | Test Conference (ITC), 2015 IEEE International |
| ISBN: | 1-4673-6578-5 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910137181403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |