1.

Record Nr.

UNINA9910137181403321

Titolo

Test Conference (ITC), 2015 IEEE International / / Institute of Electrical and Electronics Engineers

Pubbl/distr/stampa

Piscataway, NJ : , : IEEE, , 2015

ISBN

1-4673-6578-5

Descrizione fisica

1 online resource (various pagings) : illustrations

Disciplina

005.14

Soggetti

Computer software - Testing

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Sommario/riassunto

International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.