Advances in X-Ray Analysis : Proceedings of the combined First Pacific-International Congress on X-Ray Analysis Analytical Methods (PICXAM) and fortieth Annual Conference on Applications of X-Ray Analysis, held August 7-16, 1991, in Hilo and Honolulu, Hawaii / Edited by Charles S. Barrett, John V. Gilfrich ... [et al.]
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| Autore: |
Barrett, Charles Sanborn
|
| Titolo: |
Advances in X-Ray Analysis : Proceedings of the combined First Pacific-International Congress on X-Ray Analysis Analytical Methods (PICXAM) and fortieth Annual Conference on Applications of X-Ray Analysis, held August 7-16, 1991, in Hilo and Honolulu, Hawaii / Edited by Charles S. Barrett, John V. Gilfrich ... [et al.]
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| Pubblicazione: | New York [etc.] : Plenum Press, 1992 |
| Descrizione fisica: | xxx, 1333 p. ; 25 cm |
| Disciplina: | 548 |
| Soggetto non controllato: | Cristallografia |
| Raggi x | |
| Persona (resp. second.): | Gilfrich, John V. |
| Titolo autorizzato: | Advances in X-Ray Analysis |
| ISBN: | 0-306-44249-3 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 990001112270403321 |
| Lo trovi qui: | Univ. Federico II |
| Collocazione: | 37-025.034 |
| 37-025.035 | |
| Opac: | Controlla la disponibilità qui |