01203nam0-22003371i-450-9900011122704033210-306-44249-3000111227FED01000111227(Aleph)000111227FED0100011122720000920d1992----km-y0itay50------baengAdvances in X-Ray AnalysisProceedings of the combined First Pacific-International Congress on X-Ray Analysis Analytical Methods (PICXAM) and fortieth Annual Conference on Applications of X-Ray Analysis, held August 7-16, 1991, in Hilo and Honolulu, HawaiiEdited by Charles S. Barrett, John V. Gilfrich ... [et al.]New York [etc.]Plenum Press1992xxx, 1333 p.25 cmAdvances in X-Ray Analysis35A-35BCristallografiaRaggi x548Barrett,Charles Sanborn18908Gilfrich,John V.ITUNINARICAUNIMARCBK99000111227040332137-025.03418760FI137-025.0353098FI1FI1Advances in X-Ray Analysis335256UNINAING01