A rational foundation for software metrology / / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn
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| Autore: |
Flater David
|
| Titolo: |
A rational foundation for software metrology / / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn
|
| Pubblicazione: | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2016 |
| Descrizione fisica: | 1 online resource (ii, 38 pages) : illustrations (chiefly color) |
| Soggetto topico: | Computer software |
| Metrology | |
| Altri autori: |
BlackPaul E
FlaterDavid
FongElizabeth
KackerRaghy
KuhnD. Richard
OkumVadim
WoodStephen
|
| Note generali: | Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. |
| January 2016. | |
| Title from PDF title page (viewed January 31, 2016). | |
| Nota di bibliografia: | Includes bibliographical references. |
| Titolo autorizzato: | A rational foundation for software metrology |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910709600703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |