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005 20160525040643.0
024 8 $aGOVPUB-C13-281e96d0af14c3a4a83980af8b4f26e1
035   $a(CKB)5470000002478989
035   $a(OCoLC)950543951
035   $a(EXLCZ)995470000002478989
100   $a20160525d2016      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 12$aA rational foundation for software metrology /$fDavid Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2016.
215   $a1 online resource (ii, 38 pages) $cillustrations (chiefly color)
225 1 $aNISTIR ;$v8101
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aJanuary 2016.
300   $aTitle from PDF title page (viewed January 31, 2016).
320   $aIncludes bibliographical references.
606   $aComputer software
606   $aMetrology
615  0$aComputer software.
615  0$aMetrology.
700   $aFlater$b David$01387951
701   $aBlack$b Paul E$019154
701   $aFlater$b David$01387951
701   $aFong$b Elizabeth$01391831
701   $aKacker$b Raghy$01408617
701   $aKuhn$b D. Richard$01162181
701   $aOkum$b Vadim$01408618
701   $aWood$b Stephen$0315429
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709600703321
996   $aA rational foundation for software metrology$93492989
997   $aUNINA