Autore: |
Hanagal, David D.
|
Titolo: |
Software Reliability Growth Models / David D. Hanagal, Nileema N. Bhalerao
|
Pubblicazione: |
Singapore, : Springer, 2021 |
Descrizione fisica: |
xxi, 104 p. : ill. ; 24 cm |
Soggetto topico: |
68-XX - Computer science [MSC 2020] |
|
68M15 - Reliability, testing and fault tolerance of networks and computer systems [MSC 2020] |
|
68T05 - Learning and adaptive systems in artificial intelligence [MSC 2020] |
|
60G55 - Point processes (e.g., Poisson, Cox, Hawkes processes) [MSC 2020] |
|
68Q87 - Probability in computer science (algorithm analysis, random structures, phase transitions, etc.) [MSC 2020] |
|
68N01 - General topics in the theory of software [MSC 2020] |
Soggetto non controllato: |
Delayed s-shaped curve |
|
Extended inverse Weibull |
|
Fault content rate function |
|
Generalized extended inverse Weibull |
|
Generalized inverse Weibull |
|
Hazard Rate |
|
Imperfect debugging |
|
Inverse Weibull |
|
Mean value function |
|
Model selection criteria |
|
Non-homogeneous Poisson process |
|
Predictive risk ratio |
Altri autori: |
Bhalerao, Nileema N.
|
Titolo autorizzato: |
Software Reliability Growth Models  |
Formato: |
Materiale a stampa  |
Livello bibliografico |
Monografia |
Lingua di pubblicazione: |
Inglese |
Record Nr.: | VAN0275518 |
Lo trovi qui: | Univ. Vanvitelli |
Localizzazioni e accesso elettronico |
https://doi.org/10.1007/978-981-16-0025-8 |
Opac: |
Controlla la disponibilità qui |