LEADER 02635nam0 22005293i 450 001 VAN0275518 005 20240627123327.178 017 70$2N$a9789811600258 100 $a20240430d2021 |0itac50 ba 101 $aeng 102 $aSG 105 $a|||| ||||| 200 1 $aSoftware Reliability Growth Models$fDavid D. Hanagal, Nileema N. Bhalerao 210 $aSingapore$cSpringer$d2021 215 $axxi, 104 p.$cill.$d24 cm 410 1$1001VAN0108894$12001 $aInfosys Science Foundation Series$1210 $aCham [etc.]$cSpringer$d2015- 410 1$1001VAN0125139$12001 $aInfosys Science Foundation Series in Mathematical Sciences. Subseries$1210 $aBerlin [etc.]$cSpringer$d2016- 606 $a68-XX$xComputer science [MSC 2020]$3VANC019670$2MF 606 $a68M15$xReliability, testing and fault tolerance of networks and computer systems [MSC 2020]$3VANC021563$2MF 606 $a68T05$xLearning and adaptive systems in artificial intelligence [MSC 2020]$3VANC023390$2MF 606 $a60G55$xPoint processes (e.g., Poisson, Cox, Hawkes processes) [MSC 2020]$3VANC024268$2MF 606 $a68Q87$xProbability in computer science (algorithm analysis, random structures, phase transitions, etc.) [MSC 2020]$3VANC032889$2MF 606 $a68N01$xGeneral topics in the theory of software [MSC 2020]$3VANC035632$2MF 610 $aDelayed s-shaped curve$9KW:K 610 $aExtended inverse Weibull$9KW:K 610 $aFault content rate function$9KW:K 610 $aGeneralized extended inverse Weibull$9KW:K 610 $aGeneralized inverse Weibull$9KW:K 610 $aHazard Rate$9KW:K 610 $aImperfect debugging$9KW:K 610 $aInverse Weibull$9KW:K 610 $aMean value function$9KW:K 610 $aModel selection criteria$9KW:K 610 $aNon-homogeneous Poisson process$9KW:K 610 $aPredictive risk ratio$9KW:K 620 $aSG$dSingapore$3VANL000061 700 1$aHanagal$bDavid D.$3VANV098816$0782092 701 1$aBhalerao$bNileema N.$3VANV228000$01736726 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20240628$gRICA 856 4 $uhttps://doi.org/10.1007/978-981-16-0025-8$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN0275518 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08CONS e-Book 8533 $e08eMF8533 20240503 996 $aSoftware Reliability Growth Models$94156938 997 $aUNICAMPANIA