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Calibrating image roughness by estimating lipschitz exponents, with applications to image restoration
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Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery
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Method for measuring the diameter of polystyrene latex reference spheres by atomic force microscopy
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Shape-sensitive linewidth measurements of resist structures
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Strategies for scanning electron microscopy sample preparation and characterization of multiwall carbon nanotube polymer composites
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