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Albin, David S.
ID:
1382328
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Albin, David S.
Albin David S
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A novel approach for correlating capacitance data with performance during thin-film device stress studies
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Accelerated stress testing and diagnostic analysis of degradation in CdTe solar cells
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Correlations of capacitance-voltage hysteresis with thin-film CdTe solar cell performance during accelerated lifetime testing
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Degradation and capacitance-voltage hysteresis in CdTe devices
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Effect of hysteresis on measurements of thin-film cell performance
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Experiments involving correlations between CdTe solar cell fabrication history and intrinsic device stability
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Role of copper in the performance of CdS
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Role of copper in the performance of CdS
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The use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells
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