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A lattice approach to volumes irradiated by unknown sources / / James. Randa
| A lattice approach to volumes irradiated by unknown sources / / James. Randa |
| Autore | Randa James |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | RandaJames |
| Collana | NBS technical note |
| Soggetto topico | Electromagnetic measurements |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711214503321 |
Randa James
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1986 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Noise temperature measurements on wafer / / James. Randa
| Noise temperature measurements on wafer / / James. Randa |
| Autore | Randa James |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1997 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | RandaJames |
| Collana | NIST technical note |
| Soggetto topico | Electronic noise - Measurement |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711207403321 |
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Randa James
|
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Noise-temperature measurement system for the WR-28 Band / / James. Randa
| Noise-temperature measurement system for the WR-28 Band / / James. Randa |
| Autore | Randa James |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1997 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | RandaJames |
| Collana | NIST technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711206903321 |
|
Randa James
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Precision measurement of microwave thermal noise / / James Randa
| Precision measurement of microwave thermal noise / / James Randa |
| Autore | Randa James |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & Sons, , [2023] |
| Descrizione fisica | 1 online resource (179 pages) |
| Disciplina | 621.3813 |
| Soggetto topico |
Dispositius de microones
Microones - Mesuraments Microwave devices Microwave measurements |
| ISBN |
9781119910107
1-119-91011-0 1-119-91010-2 1-119-91012-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Title Page -- Copyright -- Contents -- Preface -- Chapter 1 Background -- 1.1 Nyquist's Theorem and Noise Temperature -- 1.1.1 Nyquist's Theorem -- 1.1.2 Limits and Numbers -- 1.1.3 Definition of Noise Temperature -- 1.1.4 Excess Noise Ratio and T0 -- 1.2 Microwave Networks -- 1.2.1 Notation -- 1.2.2 Noise Correlation Matrix and Bosma's Theorem -- 1.2.3 Power Ratios -- 1.2.4 Noise‐Temperature Translation Through a Passive Device -- References -- References -- Chapter 2 Noise‐Temperature Standards -- 2.1 Introduction -- 2.2 Ambient Standards -- 2.3 Hot (Oven) Standards -- 2.4 Cryogenic Standards -- 2.4.1 Coaxial Standards -- 2.4.2 Waveguide Standards -- 2.5 Other Standards and Noise Sources -- 2.5.1 Tunable Primary Standards -- 2.5.2 "Equivalent Hot Standard" Based on RF Power -- 2.5.3 Secondary Standards -- 2.5.4 Synthetic Primary Standards -- References -- Chapter 3 Noise‐Temperature Measurement -- 3.1 Background -- 3.2 Total‐Power Radiometer -- 3.2.1 Idealized Case -- 3.2.2 Nonideal Case -- 3.2.3 Radiometer Equation for Isolated Total‐Power Radiometer -- 3.2.4 Total‐Power Radiometer Design -- 3.2.5 Radiometer Testing -- 3.3 Total‐Power Radiometer Uncertainties -- 3.3.1 Type‐A Uncertainties -- 3.3.2 Type‐B Uncertainties -- 3.3.3 Sample Results -- 3.4 Other Radiometer Designs -- 3.4.1 Switching or Dicke Radiometer -- 3.4.2 Digital Radiometer -- 3.5 Measurements through Adapters -- 3.6 Traceability and Inter‐laboratory Comparisons -- References -- Chapter 4 Amplifier Noise -- 4.1 Noise Figure, Effective Input Noise Temperature -- 4.2 Noise‐Temperature Definition Revisited -- 4.3 Noise Figure Measurement, Simple Case -- 4.4 Definition of Noise Parameters -- 4.4.1 Circuit Treatment of Noisy Amplifier -- 4.4.2 Wave Representation of Noise Parameters -- 4.5 Measurement of Noise Parameters -- 4.5.1 General Measurement Setup.
4.5.2 Fit to Noise‐Figure Parameterization -- 4.5.3 Fit to Noise‐Temperature or Power Parameterization -- 4.5.4 Possible Variations When Using the Wave Formulation -- 4.5.5 Choice of Input Terminations -- 4.5.6 Commercial Systems, Source‐Pull Measurements -- 4.5.7 Frequency-Variation Method -- 4.6 Uncertainty Analysis for Noise‐Parameter Measurements -- 4.6.1 Simple Considerations -- 4.6.2 Full Analysis -- 4.6.3 Input Uncertainties -- 4.6.4 General Features and Sample Results -- 4.7 Simulations and Strategies -- References -- Chapter 5 On‐Wafer Noise Measurements -- 5.1 Introduction -- 5.2 On‐Wafer Microwave Formalism -- 5.2.1 Traveling Waves vs. Pseudo Waves -- 5.2.2 On‐Wafer Reference Planes -- 5.3 Noise‐Temperature Measurements -- 5.4 On‐Wafer Noise‐Parameter Measurements -- 5.4.1 General -- 5.4.2 Radiometer‐Based Systems -- 5.4.3 Commercial Systems and Reference‐Plane Considerations -- 5.4.4 "Enhanced" or Model‐Assisted Measurements -- 5.5 Uncertainties -- 5.5.1 Differences from Packaged Amplifiers -- 5.5.2 General Features and Properties -- 5.5.3 Measurement Strategies -- References -- Chapter 6 Noise‐Parameter Checks and Verification -- 6.1 Measurement of Passive or Previously Measured Devices -- 6.2 Physical Bounds and Model Predictions -- 6.3 Tandem or Hybrid Measurements -- References -- Chapter 7 Cryogenic Amplifiers -- 7.1 Background -- 7.1.1 Introduction -- 7.1.2 Vacuum‐Fluctuation Contribution -- 7.2 Measurement of the Matched Noise Figure -- 7.2.1 Cold‐Attenuator Method -- 7.2.2 Internal Hot-Cold Method -- 7.2.3 Full‐Characterization Measurements -- 7.3 Noise‐Parameter Measurement -- References -- Chapter 8 Multiport Amplifiers -- 8.1 Introduction -- 8.2 Formalism and Noise Matrix -- 8.3 Definition of Noise Figure for Multiports -- 8.4 Degradation of Signal‐to‐Noise Ratio. 8.5 Three‐Port Example - Differential Amplifier with Reflectionless Terminations -- 8.5.1 Motivation -- 8.5.2 Characteristic Noise Temperature, Gains, and Effective Input Noise Temperature -- 8.5.3 Noise Figure -- 8.5.4 Practical Applications -- 8.6 Four‐Port Example with Reflectionless Terminations -- References -- Chapter 9 Remote Sensing Connection -- 9.1 Introduction -- 9.2 Theory for Standard Radiometer -- 9.3 Standard‐Radiometer Measurements -- 9.3.1 Determination of α -- 9.3.2 Determination of Illumination Efficiency, ηIE -- 9.3.2.1 Measurements of a Standard Target -- 9.4 Standard‐Target Design -- 9.5 Target Reflectivity Effects -- 9.5.1 Effect of Target Reflectivity -- 9.5.2 Measurement of Target Reflectivity -- References -- Index -- EULA. |
| Record Nr. | UNINA-9910830286103321 |
|
Randa James
|
||
| Hoboken, New Jersey : , : John Wiley & Sons, , [2023] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Precision Measurement of Microwave Thermal Noise
| Precision Measurement of Microwave Thermal Noise |
| Autore | Randa James |
| Pubbl/distr/stampa | Newark : , : John Wiley & Sons, Incorporated, , 2022 |
| Descrizione fisica | 1 online resource (179 pages) |
| ISBN |
1-119-91011-0
1-119-91010-2 1-119-91012-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Title Page -- Copyright -- Contents -- Preface -- Chapter 1 Background -- 1.1 Nyquist's Theorem and Noise Temperature -- 1.1.1 Nyquist's Theorem -- 1.1.2 Limits and Numbers -- 1.1.3 Definition of Noise Temperature -- 1.1.4 Excess Noise Ratio and T0 -- 1.2 Microwave Networks -- 1.2.1 Notation -- 1.2.2 Noise Correlation Matrix and Bosma's Theorem -- 1.2.3 Power Ratios -- 1.2.4 Noise‐Temperature Translation Through a Passive Device -- References -- References -- Chapter 2 Noise‐Temperature Standards -- 2.1 Introduction -- 2.2 Ambient Standards -- 2.3 Hot (Oven) Standards -- 2.4 Cryogenic Standards -- 2.4.1 Coaxial Standards -- 2.4.2 Waveguide Standards -- 2.5 Other Standards and Noise Sources -- 2.5.1 Tunable Primary Standards -- 2.5.2 "Equivalent Hot Standard" Based on RF Power -- 2.5.3 Secondary Standards -- 2.5.4 Synthetic Primary Standards -- References -- Chapter 3 Noise‐Temperature Measurement -- 3.1 Background -- 3.2 Total‐Power Radiometer -- 3.2.1 Idealized Case -- 3.2.2 Nonideal Case -- 3.2.3 Radiometer Equation for Isolated Total‐Power Radiometer -- 3.2.4 Total‐Power Radiometer Design -- 3.2.5 Radiometer Testing -- 3.3 Total‐Power Radiometer Uncertainties -- 3.3.1 Type‐A Uncertainties -- 3.3.2 Type‐B Uncertainties -- 3.3.3 Sample Results -- 3.4 Other Radiometer Designs -- 3.4.1 Switching or Dicke Radiometer -- 3.4.2 Digital Radiometer -- 3.5 Measurements through Adapters -- 3.6 Traceability and Inter‐laboratory Comparisons -- References -- Chapter 4 Amplifier Noise -- 4.1 Noise Figure, Effective Input Noise Temperature -- 4.2 Noise‐Temperature Definition Revisited -- 4.3 Noise Figure Measurement, Simple Case -- 4.4 Definition of Noise Parameters -- 4.4.1 Circuit Treatment of Noisy Amplifier -- 4.4.2 Wave Representation of Noise Parameters -- 4.5 Measurement of Noise Parameters -- 4.5.1 General Measurement Setup.
4.5.2 Fit to Noise‐Figure Parameterization -- 4.5.3 Fit to Noise‐Temperature or Power Parameterization -- 4.5.4 Possible Variations When Using the Wave Formulation -- 4.5.5 Choice of Input Terminations -- 4.5.6 Commercial Systems, Source‐Pull Measurements -- 4.5.7 Frequency-Variation Method -- 4.6 Uncertainty Analysis for Noise‐Parameter Measurements -- 4.6.1 Simple Considerations -- 4.6.2 Full Analysis -- 4.6.3 Input Uncertainties -- 4.6.4 General Features and Sample Results -- 4.7 Simulations and Strategies -- References -- Chapter 5 On‐Wafer Noise Measurements -- 5.1 Introduction -- 5.2 On‐Wafer Microwave Formalism -- 5.2.1 Traveling Waves vs. Pseudo Waves -- 5.2.2 On‐Wafer Reference Planes -- 5.3 Noise‐Temperature Measurements -- 5.4 On‐Wafer Noise‐Parameter Measurements -- 5.4.1 General -- 5.4.2 Radiometer‐Based Systems -- 5.4.3 Commercial Systems and Reference‐Plane Considerations -- 5.4.4 "Enhanced" or Model‐Assisted Measurements -- 5.5 Uncertainties -- 5.5.1 Differences from Packaged Amplifiers -- 5.5.2 General Features and Properties -- 5.5.3 Measurement Strategies -- References -- Chapter 6 Noise‐Parameter Checks and Verification -- 6.1 Measurement of Passive or Previously Measured Devices -- 6.2 Physical Bounds and Model Predictions -- 6.3 Tandem or Hybrid Measurements -- References -- Chapter 7 Cryogenic Amplifiers -- 7.1 Background -- 7.1.1 Introduction -- 7.1.2 Vacuum‐Fluctuation Contribution -- 7.2 Measurement of the Matched Noise Figure -- 7.2.1 Cold‐Attenuator Method -- 7.2.2 Internal Hot-Cold Method -- 7.2.3 Full‐Characterization Measurements -- 7.3 Noise‐Parameter Measurement -- References -- Chapter 8 Multiport Amplifiers -- 8.1 Introduction -- 8.2 Formalism and Noise Matrix -- 8.3 Definition of Noise Figure for Multiports -- 8.4 Degradation of Signal‐to‐Noise Ratio. 8.5 Three‐Port Example - Differential Amplifier with Reflectionless Terminations -- 8.5.1 Motivation -- 8.5.2 Characteristic Noise Temperature, Gains, and Effective Input Noise Temperature -- 8.5.3 Noise Figure -- 8.5.4 Practical Applications -- 8.6 Four‐Port Example with Reflectionless Terminations -- References -- Chapter 9 Remote Sensing Connection -- 9.1 Introduction -- 9.2 Theory for Standard Radiometer -- 9.3 Standard‐Radiometer Measurements -- 9.3.1 Determination of α -- 9.3.2 Determination of Illumination Efficiency, ηIE -- 9.3.2.1 Measurements of a Standard Target -- 9.4 Standard‐Target Design -- 9.5 Target Reflectivity Effects -- 9.5.1 Effect of Target Reflectivity -- 9.5.2 Measurement of Target Reflectivity -- References -- Index -- EULA. |
| Record Nr. | UNINA-9910642871203321 |
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Randa James
|
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| Newark : , : John Wiley & Sons, Incorporated, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Uncertainties in NIST noises-temperature measurements / / James. Randa
| Uncertainties in NIST noises-temperature measurements / / James. Randa |
| Autore | Randa James |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1998 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | RandaJames |
| Collana | NIST technical note |
| Soggetto topico | Electromagnetic noise - Measurement |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711203203321 |
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Randa James
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Uncertainty analysis for NIST noise-parameter measurements [[electronic resource] /] / James Randa
| Uncertainty analysis for NIST noise-parameter measurements [[electronic resource] /] / James Randa |
| Autore | Randa James |
| Pubbl/distr/stampa | Boulder, CO : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2008] |
| Descrizione fisica | 1 online resource (iii, 31 pages) : illustrations (some color) |
| Collana | NIST technical note |
| Soggetto topico |
Electronic noise - Measurement
Uncertainty (Information theory) - Mathematical models |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910697199403321 |
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Randa James
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| Boulder, CO : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2008] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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