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Topological Structures in Ferroic Materials [[electronic resource] ] : Domain Walls, Vortices and Skyrmions / / edited by Jan Seidel
| Topological Structures in Ferroic Materials [[electronic resource] ] : Domain Walls, Vortices and Skyrmions / / edited by Jan Seidel |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (249 p.) |
| Disciplina | 530 |
| Collana | Springer Series in Materials Science |
| Soggetto topico |
Magnetism
Magnetic materials Solid state physics Nanotechnology Semiconductors Nanoscale science Nanoscience Nanostructures Magnetism, Magnetic Materials Solid State Physics Nanoscale Science and Technology |
| ISBN | 3-319-25301-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Charged domain walls in ferroelectrics -- Multiferroic domain wall theory -- Modelling of domain wall properties in ferroelectrics -- Magnetic domain walls -- Magnetic topological spin structures in confined geometries -- Nucleation and propagation of kink solitons in antiferromagnetically coupled layers using the spin-flop transition -- Skyrmions in chiral magnets (experiment) -- Skyrmions in chiral magnets (theory) -- Ferroic vortex structures and ferroelastic domain walls -- Vortex and Vertex domains in ferroelectrics: statics and dynamics. |
| Record Nr. | UNINA-9910254628303321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Topology in Magnetism [[electronic resource] /] / edited by Jiadong Zang, Vincent Cros, Axel Hoffmann
| Topology in Magnetism [[electronic resource] /] / edited by Jiadong Zang, Vincent Cros, Axel Hoffmann |
| Edizione | [1st ed. 2018.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
| Descrizione fisica | 1 online resource (426 pages) |
| Disciplina | 514 |
| Collana | Springer Series in Solid-State Sciences |
| Soggetto topico |
Magnetism
Magnetic materials Solid state physics Structural materials Quantum computers Spintronics Microwaves Optical engineering Magnetism, Magnetic Materials Solid State Physics Structural Materials Quantum Information Technology, Spintronics Microwaves, RF and Optical Engineering |
| ISBN | 3-319-97334-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Overview -- Magnetic Solitons -- Domain Walls -- Vortices -- Bulk Skyrmions -- Thin-Film Skyrmions -- Dynamical Solitons -- Transport Phenomena -- Anomalous Hall Effect -- Spin Hall Effect -- Topological Insulator -- Weyl Semimetal -- Majorana Fermions -- Additional Topics -- Frustrated Magnetism -- Spin Liquid -- Antiferromagnets -- Multiferroicity -- Magnons. |
| Record Nr. | UNINA-9910300551503321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Towards a Compact Thin-Disk-Based Femtosecond XUV Source [[electronic resource] /] / by Oleg Pronin
| Towards a Compact Thin-Disk-Based Femtosecond XUV Source [[electronic resource] /] / by Oleg Pronin |
| Autore | Pronin Oleg |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 |
| Descrizione fisica | 1 online resource (139 p.) |
| Disciplina | 530 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Lasers
Photonics Optics Electrodynamics Solid state physics Optics, Lasers, Photonics, Optical Devices Classical Electrodynamics Solid State Physics |
| ISBN | 3-319-01511-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Basics of mode-locking -- High-power thin-disk resonator and gain medium -- SESAM mode-locked thin-disk oscillator -- Kerr-lens mode-locked thin-disk oscillator -- Towards ultrashort CE phase stable pulses -- XUV output coupler and XUV/IR grazing-incidence beam splitter -- Conclusion. |
| Record Nr. | UNINA-9910300390303321 |
Pronin Oleg
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Towards the Optical Control of Resonantly Bonded Materials [[electronic resource] ] : An Ultrafast X-Ray Study / / by Yijing Huang
| Towards the Optical Control of Resonantly Bonded Materials [[electronic resource] ] : An Ultrafast X-Ray Study / / by Yijing Huang |
| Autore | Huang Yijing |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2023 |
| Descrizione fisica | 1 online resource (165 pages) |
| Disciplina | 530.416 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Lasers
Optical spectroscopy Condensed matter Solid state physics Laser Laser-Matter Interaction Optical Spectroscopy Structure of Condensed Matter Electronic Devices Phase Transition and Critical Phenomena |
| ISBN | 3-031-42826-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1: Ultrafast X-ray Scattering and Nonequilibrium States of Matter -- Chapter 2: Lattice Dynamics: Excitation and Probe -- Chapter 3: Resonantly Bonded Semiconductors -- Chapter 4: Ultrafast Lasers and X-ray Pump Probe Experiment -- Chapter 5: Photoinduced Novel Lattice Instability in SnSe. |
| Record Nr. | UNINA-9910805575603321 |
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Huang Yijing
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| Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Transition-Metal Defects in Silicon [[electronic resource] ] : New Insights from Photoluminescence Studies of Highly Enriched 28Si / / by Michael Steger
| Transition-Metal Defects in Silicon [[electronic resource] ] : New Insights from Photoluminescence Studies of Highly Enriched 28Si / / by Michael Steger |
| Autore | Steger Michael |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013 |
| Descrizione fisica | 1 online resource (107 p.) |
| Disciplina |
537.6
537.6223 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Solid state physics
Spectroscopy Microscopy Metals Materials science Solid State Physics Spectroscopy and Microscopy Metallic Materials Characterization and Evaluation of Materials |
| ISBN |
1-299-40843-5
3-642-35079-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction and Background -- History of the Observed Centres in Silicon -- Experimental Method -- Results -- Discussion and Conclusion. |
| Record Nr. | UNINA-9910437974703321 |
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Steger Michael
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter
| Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter |
| Autore | Williams David B |
| Edizione | [1st ed. 1996.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XXIX, 729 p. 1722 illus.) |
| Disciplina | 621.36 |
| Soggetto topico |
Spectroscopy
Microscopy Surfaces (Physics) Interfaces (Physical sciences) Thin films Solid state physics Materials science Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Characterization and Evaluation of Materials Biological Microscopy |
| ISBN | 1-4757-2519-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to “See” Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures. |
| Record Nr. | UNINA-9910480823503321 |
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Williams David B
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| New York, NY : , : Springer US : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter
| Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter |
| Autore | Williams David B |
| Edizione | [1st ed. 1996.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XXIX, 729 p. 1722 illus.) |
| Disciplina | 621.36 |
| Soggetto topico |
Spectroscopy
Microscopy Surfaces (Physics) Interfaces (Physical sciences) Thin films Solid state physics Materials science Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Characterization and Evaluation of Materials Biological Microscopy |
| ISBN | 1-4757-2519-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to “See” Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures. |
| Record Nr. | UNINA-9910792480003321 |
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Williams David B
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| New York, NY : , : Springer US : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter
| Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter |
| Autore | Williams David B |
| Edizione | [1st ed. 1996.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XXIX, 729 p. 1722 illus.) |
| Disciplina | 621.36 |
| Soggetto topico |
Spectroscopy
Microscopy Surfaces (Physics) Interfaces (Physical sciences) Thin films Solid state physics Materials science Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Characterization and Evaluation of Materials Biological Microscopy |
| ISBN | 1-4757-2519-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to “See” Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures. |
| Record Nr. | UNINA-9910821729903321 |
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Williams David B
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| New York, NY : , : Springer US : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Transmission Electron Microscopy [[electronic resource] ] : Diffraction, Imaging, and Spectrometry / / edited by C. Barry Carter, David B. Williams
| Transmission Electron Microscopy [[electronic resource] ] : Diffraction, Imaging, and Spectrometry / / edited by C. Barry Carter, David B. Williams |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (XXXIII, 518 p. 300 illus.) |
| Disciplina | 502.825 |
| Soggetto topico |
Materials science
Nanoscale science Nanoscience Nanostructures Spectroscopy Solid state physics Microscopy Mechanics Mechanics, Applied Characterization and Evaluation of Materials Nanoscale Science and Technology Spectroscopy/Spectrometry Solid State Physics Spectroscopy and Microscopy Solid Mechanics |
| ISBN | 3-319-26651-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS. |
| Record Nr. | UNINA-9910254058703321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Transport and NMR Studies of Charge Glass in Organic Conductors with Quasi-triangular Lattices [[electronic resource] /] / by Takuro Sato
| Transport and NMR Studies of Charge Glass in Organic Conductors with Quasi-triangular Lattices [[electronic resource] /] / by Takuro Sato |
| Autore | Sato Takuro |
| Edizione | [1st ed. 2017.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2017 |
| Descrizione fisica | 1 online resource (XII, 77 p. 62 illus., 47 illus. in color.) |
| Disciplina | 530.41 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Solid state physics
Amorphous substances Complex fluids Superconductivity Superconductors Spectroscopy Microscopy Phase transitions (Statistical physics) Solid State Physics Soft and Granular Matter, Complex Fluids and Microfluidics Strongly Correlated Systems, Superconductivity Spectroscopy and Microscopy Phase Transitions and Multiphase Systems |
| ISBN | 981-10-5879-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Background Information -- Experimental -- Charge-Glass State in θ-(BEDT-TTF)2X -- Electronic Crystal Growth -- Conclusions. |
| Record Nr. | UNINA-9910254600003321 |
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Sato Takuro
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| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Soggetto topico
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Solid state physics
(521)
- Solid State Physics (294)
- Spectroscopy (86)
- Microscopy (85)
- Spectroscopy and Microscopy (84)