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Electrochemical Dictionary [[electronic resource] /] / edited by Allen J. Bard, György Inzelt, Fritz Scholz
| Electrochemical Dictionary [[electronic resource] /] / edited by Allen J. Bard, György Inzelt, Fritz Scholz |
| Edizione | [2nd ed. 2012.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2012 |
| Descrizione fisica | 1 online resource (993 p.) |
| Disciplina | 541.3703 |
| Soggetto topico |
Electrochemistry
Energy storage Materials science Energy systems Solid state physics Analytical chemistry Energy Storage Characterization and Evaluation of Materials Energy Systems Solid State Physics Analytical Chemistry |
| ISBN |
1-283-69743-2
3-642-29551-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Electrochemical Dictionary; Preface to the Second Edition; Preface to the First Edition; List of Contributors; A; B; C; D; E; F; G; H; I; J; K; L; M; N; O; P; Q; R; S; T; U; V; W; X; Y; Z |
| Record Nr. | UNINA-9910826177603321 |
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic Characterisation of Earth‐Abundant Sulphides for Solar Photovoltaics [[electronic resource] /] / by Thomas James Whittles
| Electronic Characterisation of Earth‐Abundant Sulphides for Solar Photovoltaics [[electronic resource] /] / by Thomas James Whittles |
| Autore | Whittles Thomas James |
| Edizione | [1st ed. 2018.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
| Descrizione fisica | 1 online resource (385 pages) |
| Disciplina | 621.31244 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Materials science
Force and energy Solid state physics Spectroscopy Microscopy Optical materials Electronic materials Energy Materials Solid State Physics Spectroscopy and Microscopy Optical and Electronic Materials |
| ISBN | 3-319-91665-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Experimental Methods -- The Electronic Structure of CuSbS₂ for Use as a PV Absorber -- The Electronic Structure of Cu₃BiS₃ for Use as a PV Absorber -- The Electronic Structure of Cu₃BiS₃ for Use as a PV Absorber -- The Use of Photoemission Spectroscopies for the Characterisation and Identification of Cu₂ZnSnS₄ and its Secondary Phases -- Conclusions and Recommendations for the Future. |
| Record Nr. | UNINA-9910392752503321 |
Whittles Thomas James
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger
| Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger |
| Autore | Rüeger Jean M |
| Edizione | [4th ed. 1996.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XIX, 276 p.) |
| Disciplina | 526/.028 |
| Soggetto topico |
Geophysics
Geographical information systems Solid state physics Spectroscopy Microscopy Geophysics/Geodesy Geographical Information Systems/Cartography Solid State Physics Spectroscopy and Microscopy |
| ISBN | 3-642-80233-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. |
| Record Nr. | UNINA-9910480349803321 |
|
Rüeger Jean M
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger
| Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger |
| Autore | Rüeger Jean M |
| Edizione | [4th ed. 1996.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XIX, 276 p.) |
| Disciplina | 526/.028 |
| Soggetto topico |
Geophysics
Geographical information systems Solid state physics Spectroscopy Microscopy Geophysics/Geodesy Geographical Information Systems/Cartography Solid State Physics Spectroscopy and Microscopy |
| ISBN | 3-642-80233-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. |
| Record Nr. | UNINA-9910789208203321 |
|
Rüeger Jean M
|
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger
| Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger |
| Autore | Rüeger Jean M |
| Edizione | [4th ed. 1996.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XIX, 276 p.) |
| Disciplina | 526/.028 |
| Soggetto topico |
Geophysics
Geographical information systems Solid state physics Spectroscopy Microscopy Geophysics/Geodesy Geographical Information Systems/Cartography Solid State Physics Spectroscopy and Microscopy |
| ISBN | 3-642-80233-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. |
| Record Nr. | UNINA-9910820311303321 |
|
Rüeger Jean M
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic Properties of Organic Conductors [[electronic resource] /] / by Takehiko Mori
| Electronic Properties of Organic Conductors [[electronic resource] /] / by Takehiko Mori |
| Autore | Mori Takehiko |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Tokyo : , : Springer Japan : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (X, 356 p. 288 illus., 34 illus. in color.) |
| Disciplina |
620.11295
620.11297 |
| Soggetto topico |
Optical materials
Electronic materials Physical chemistry Solid state physics Organic chemistry Optical and Electronic Materials Physical Chemistry Solid State Physics Organic Chemistry |
| ISBN | 4-431-55264-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Quantum Chemistry of Molecules -- Quantum Chemistry of Solids -- Transport Properties -- Magnetism -- Electron Correlation -- Superconductivity -- Charge-Transfer Complexes -- Organic Semiconductors. |
| Record Nr. | UNINA-9910254039303321 |
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Mori Takehiko
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| Tokyo : , : Springer Japan : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions [[electronic resource] /] / by Kazuto Akiba
| Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions [[electronic resource] /] / by Kazuto Akiba |
| Autore | Akiba Kazuto |
| Edizione | [1st ed. 2019.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (XXIV, 147 p. 91 illus., 56 illus. in color.) |
| Disciplina | 537.622 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Semiconductors
Optical materials Electronic materials Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials science Solid state physics Optical and Electronic Materials Surface and Interface Science, Thin Films Characterization and Evaluation of Materials Solid State Physics |
| ISBN | 981-13-7107-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | General Introduction -- Experimental Methods -- Black Phosphorus -- Lead Telluride -- Concluding Remarks. |
| Record Nr. | UNINA-9910350229703321 |
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Akiba Kazuto
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| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Elektrische Messtechnik [[electronic resource] ] : Analoge, digitale und computergestützte Verfahren / / von Reinhard Lerch
| Elektrische Messtechnik [[electronic resource] ] : Analoge, digitale und computergestützte Verfahren / / von Reinhard Lerch |
| Autore | Lerch Reinhard |
| Edizione | [7th ed. 2016.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer Vieweg, , 2016 |
| Descrizione fisica | 1 online resource (XXXI, 744 S. 533 Abb.) |
| Disciplina | 621.382 |
| Soggetto topico |
Signal processing
Image processing Speech processing systems Control engineering Robotics Mechatronics Solid state physics Spectroscopy Microscopy Physics Signal, Image and Speech Processing Control, Robotics, Mechatronics Solid State Physics Spectroscopy and Microscopy Numerical and Computational Physics, Simulation |
| ISBN | 3-662-46941-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | ger |
| Nota di contenuto | Umfang und Bedeutung der Elektrischen Messtechnik -- Die Grundlagen des Messens -- Ausgleichsvorgänge, Frequenz-Transformation und Vierpol-Übertragungsverhalten -- Nichtlineare Bauelemente, Schaltungen und Systeme -- Messfehler -- Analoges Messen elektrischer Größen -- Messverstärker -- Messung der elektrischen Leistung -- Messung von elektrischen Impedanzen -- Darstellung des Zeitverlaufs elektrischer Signale -- Digitale Messtechnik -- Die Messung von Frequenz und Zeit -- Messsignalverarbeitung -- Regression, lineare Korrelation und Hypothesen-Testverfahren -- Grundlagen der rechnergestützten Messdatenerfassung -- Messdatenerfassung im Labor -- Messdatenerfassung im Feld -- Vernetzung von Messdatenrechnern (Industri-LAN, WAN) -- Programmierung von Messdatenerfassungssystemen -- Gebäudeautomatisierung (Smart Home) -- Literatur- und Sachverzeichnis. |
| Record Nr. | UNINA-9910485153303321 |
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Lerch Reinhard
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer Vieweg, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Elementary electronic structure / Walter A. Harrison
| Elementary electronic structure / Walter A. Harrison |
| Autore | Harrison, Walter A. |
| Edizione | [Rev. ed.] |
| Pubbl/distr/stampa | River Edge, N.J. : World Scientific, c2004 |
| Descrizione fisica | xx, 838 p. : ill. ; 23 cm |
| Disciplina | 530.411 |
| Soggetto topico |
Electronic structure
Chemical bonds Solid state physics |
| ISBN |
9812387072
9812387080 (pbk.) |
| Classificazione |
LC QC1.8.E4
53.1.4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001776449707536 |
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Harrison, Walter A.
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| River Edge, N.J. : World Scientific, c2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Elementary solid state physics : a short course / Charles Kittel
| Elementary solid state physics : a short course / Charles Kittel |
| Autore | Kittel, Charles |
| Descrizione fisica | xii, 339 p. : ill. ; 24 cm |
| Disciplina | 531 |
| Soggetto topico | Solid state physics |
| Classificazione |
AMS 74-01
LC QC171.K5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Crystal structure ; Diffraction of waves by crystals ; Thermal properties of solids ; Dielectric properties ; Free electron model of metals ; Band theory of solids: Brillouin zones ; Semiconductors: Physics and devices ; Magnetism and magnetic resonance ; Dislocations: Strength of solids |
| Titolo uniforme | |
| Record Nr. | UNISALENTO-991003411079707536 |
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Kittel, Charles
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| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Soggetto topico
-
Solid state physics
(521)
- Solid State Physics (294)
- Spectroscopy (86)
- Microscopy (85)
- Spectroscopy and Microscopy (84)