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GLSVLSI '16 : proceedings of the 2016 ACM Great Lakes Symposium on VLSI : May 18-20, 2016, Boston, MA, USA / / sponsored by ACM SIGSAC
GLSVLSI '16 : proceedings of the 2016 ACM Great Lakes Symposium on VLSI : May 18-20, 2016, Boston, MA, USA / / sponsored by ACM SIGSAC
Pubbl/distr/stampa New York : , : ACM, , 2016
Descrizione fisica 1 online resource (446 pages)
Disciplina 621.395
Soggetto topico Integrated circuits - Very large scale integration
Computer-aided design
Electronic circuit design
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910137081103321
New York : , : ACM, , 2016
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GLSVLSI '16 : proceedings of the 2016 ACM Great Lakes Symposium on VLSI : May 18-20, 2016, Boston, MA, USA / / sponsored by ACM SIGSAC
GLSVLSI '16 : proceedings of the 2016 ACM Great Lakes Symposium on VLSI : May 18-20, 2016, Boston, MA, USA / / sponsored by ACM SIGSAC
Pubbl/distr/stampa New York : , : ACM, , 2016
Descrizione fisica 1 online resource (446 pages)
Disciplina 621.395
Soggetto topico Integrated circuits - Very large scale integration
Computer-aided design
Electronic circuit design
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996280962903316
New York : , : ACM, , 2016
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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GLSVLSI '17 : proceedings of the Great Lakes Symposium on VLSI 2017 : May 10-12, 2017 : Banff, Alberta, Canada / / Association for Computing Machinery
GLSVLSI '17 : proceedings of the Great Lakes Symposium on VLSI 2017 : May 10-12, 2017 : Banff, Alberta, Canada / / Association for Computing Machinery
Pubbl/distr/stampa New York, NY : , : The Association for Computing Machinery, , [2017]
Descrizione fisica 1 online resource : illustrations
Disciplina 005.8
Soggetto topico Computer security
Computer-aided design
Electronic circuit design
Integrated circuits - Very large scale integration
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910375767203321
New York, NY : , : The Association for Computing Machinery, , [2017]
Materiale a stampa
Lo trovi qui: Univ. Federico II
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GLSVLSI '22 : proceedings of the Great Lakes Symposium on VLSI 2022 : June 6-8, 2022, ,Irvine, CA, USA / / general chairs, Ioannis Savidis, Avesta Sasan
GLSVLSI '22 : proceedings of the Great Lakes Symposium on VLSI 2022 : June 6-8, 2022, ,Irvine, CA, USA / / general chairs, Ioannis Savidis, Avesta Sasan
Pubbl/distr/stampa New York : , : Association for Computing Machinery, , 2022
Descrizione fisica 1 online resource (560 pages) : illustrations
Disciplina 621.395
Collana ACM Conferences
Soggetto topico Integrated circuits - Very large scale integration
Machine learning
Computer security
Computer-aided design
Electronic circuit design
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910580193103321
New York : , : Association for Computing Machinery, , 2022
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Lo trovi qui: Univ. Federico II
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GLSVLSI'18 : proceedings of the 2018 Great Lakes Symposium on VLSI : May 23-25, 2018, Chicago, IL, USA / / Great Lakes Symposium on VLSI 2018 ; Deming Chen, program chair ; Association for Computing Machinery-Digital Library, contributor
GLSVLSI'18 : proceedings of the 2018 Great Lakes Symposium on VLSI : May 23-25, 2018, Chicago, IL, USA / / Great Lakes Symposium on VLSI 2018 ; Deming Chen, program chair ; Association for Computing Machinery-Digital Library, contributor
Pubbl/distr/stampa New York NY : , : ACM, , 2018
Descrizione fisica 1 online resource (183 pages) : illustrations
Disciplina 621.395
Soggetto topico Integrated circuits - Very large scale integration
Electronic circuit design
Computer-aided design
Computer security
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910375973203321
New York NY : , : ACM, , 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Hardware Security Primitives [[electronic resource] /] / by Mark Tehranipoor, Nitin Pundir, Nidish Vashistha, Farimah Farahmandi
Hardware Security Primitives [[electronic resource] /] / by Mark Tehranipoor, Nitin Pundir, Nidish Vashistha, Farimah Farahmandi
Autore Tehranipoor Mohammad H. <1974->
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023
Descrizione fisica 1 online resource (356 pages)
Disciplina 929.605
Soggetto topico Electronic circuits
Electronic circuit design
Microprocessors
Computer architecture
Electronic Circuits and Systems
Electronics Design and Verification
Processor Architectures
ISBN 3-031-19185-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction -- Hardware Security Primitives and their Applications -- Racetrack PUF -- TERO PUF -- Direct Characterization PUF -- Volatile Memory Based PUF -- Emerging Memory Based PUF -- Extrinsic Characterization of PUF -- Radio PUFs and CoAs -- Optical PUFs -- True Random Number Generators -- Hardware Camouflaging -- Temper Detection Methods -- Embedded Watermarking -- Counterfeit and Recycled IC Detection -- Package-Level Counterfeit IC Detection -- Side Channels Protection in Cryptographic Hardware -- Fault Injection Resistant Cryptographic Hardware -- Energy and Performance Optimization for Cryptography -- Lightweight Cryptography -- Post-Quantum Cryptography -- Virtual Proof of Reality -- Analog Security.
Record Nr. UNINA-9910635396903321
Tehranipoor Mohammad H. <1974->  
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Hardware Security Training, Hands-on! [[electronic resource] /] / by Mark Tehranipoor, N. Nalla Anandakumar, Farimah Farahmandi
Hardware Security Training, Hands-on! [[electronic resource] /] / by Mark Tehranipoor, N. Nalla Anandakumar, Farimah Farahmandi
Autore Tehranipoor Mark
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023
Descrizione fisica 1 online resource (XXIV, 320 p. 250 illus., 218 illus. in color.)
Disciplina 621.3815
Soggetto topico Electronic circuits
Embedded computer systems
Electronic circuit design
Electronic Circuits and Systems
Embedded Systems
Electronics Design and Verification
ISBN 3-031-31034-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Chapter 1. Physical Unclonable Functions (PUFs) -- Chapter 2. True Random Number Generator (TRNG) -- Chapter 3. Recycled Chip Detection using RO-based Odometer -- Chapter 4. Recycled FPGA Detection -- Chapter 5. Hardware Trojan Insertion -- Chapter 6. Hardware Trojan Detection -- Chapter 7. Security Verification -- Chapter 8. Power Analysis Attacks on AES -- Chapter 9. EM Side-Channel Attack on AES -- Chapter 10. Logic Locking Insertion and Assessment -- Chapter 11. Clock Glitch Fault Attack on FSM in AES Controller -- Chapter 12. Voltage Glitch Attack on an FPGA AES Implementation -- Chapter 13. Laser Fault Injection Attack (FIA) -- Chapter 14. Optical Probing Attack on Logic Locking -- Chapter 15. Universal Fault Sensor -- Chapter 16. Scanning Electron Microscope Training.
Record Nr. UNINA-9910742492103321
Tehranipoor Mark  
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023
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Lo trovi qui: Univ. Federico II
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Heterojunction bipolar transistors for circuit design : microwave modelling and parameter extraction / / Jianjun Gao
Heterojunction bipolar transistors for circuit design : microwave modelling and parameter extraction / / Jianjun Gao
Autore Gao Jianjun <1968->
Pubbl/distr/stampa Singapore : , : John Wiley and Sons, Incorporated, , 2015
Descrizione fisica 1 online resource (278 p.)
Disciplina 621.3815/28
Soggetto topico Bipolar transistors
Heterojunctions
Electronic circuit design
Microwave measurements
ISBN 1-118-92153-4
1-118-92155-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Title Page; Copyright Page; Contents; About the Author; Preface; Acknowledgments; Nomenclature; Chapter 1 Introduction; 1.1 Overview of Heterojunction Bipolar Transistors; 1.2 Modeling and Measurement for HBT; 1.3 Organization of This Book; References; Chapter 2 Basic Concept of Microwave Device Modeling; 2.1 Signal Parameters; 2.1.1 Low-Frequency Parameters; 2.1.2 S-Parameters; 2.2 Representation of Noisy Two-Port Network; 2.2.1 Noise Matrix; 2.2.2 Noise Parameters; 2.3 Basic Circuit Elements; 2.3.1 Resistance; 2.3.2 Capacitance; 2.3.3 Inductance; 2.3.4 Controlled Sources
2.3.5 Ideal Transmission Line2.4 π- and T-Type Networks; 2.4.1 T-Type Network; 2.4.2 π-Type Network; 2.4.3 Relationship between π- and T-Type Networks; 2.5 Deembedding Method; 2.5.1 Parallel Deembedding; 2.5.2 Series Deembedding; 2.5.3 Cascading Deembedding; 2.6 Basic Methods of Parameter Extraction; 2.6.1 Determination of Capacitance; 2.6.2 Determination of Inductance; 2.6.3 Determination of Resistance; 2.7 Summary; References; Chapter 3 Modeling and Parameter Extraction Methods of Bipolar Junction Transistor; 3.1 PN Junction; 3.2 PN Junction Diode; 3.2.1 Basic Concept
3.2.2 Equivalent Circuit Model3.2.3 Determination of Model Parameters; 3.3 BJT Physical Operation; 3.3.1 Device Structure; 3.3.2 The Modes of Operation; 3.3.3 Base-Width Modulation; 3.3.4 High Injection and Current Crowding; 3.4 Equivalent Circuit Model; 3.4.1 E-M Model; 3.4.2 G-P Model; 3.4.3 Noise Model; 3.5 Microwave Performance; 3.5.1 Transition Frequency; 3.5.2 Common-Emitter Configuration; 3.5.3 Common-Base Configuration; 3.5.4 Common-Collector Configuration; 3.5.5 Summary and Comparisons; 3.6 Summary; References; Chapter 4 Basic Principle of HBT; 4.1 Semiconductor Heterojunction
4.2 HBT Device4.2.1 GaAs HBT; 4.2.2 InP HBT; 4.3 Summary; References; Chapter 5 Small-Signal Modeling and Parameter Extraction of HBT; 5.1 Small-Signal Circuit Model; 5.1.1 Pad Structure; 5.1.2 T-Type Circuit Model; 5.1.3 π-Type Circuit Model; 5.1.4 Unilateral Power Gain; 5.1.5 fT and fmax; 5.2 HBT Device Structure; 5.3 Extraction Method of PAD Capacitances; 5.3.1 Open Test Structure Method; 5.3.2 Pinch-Off Method; 5.4 Extraction Method of Extrinsic Inductances; 5.4.1 Short Test Structure Method; 5.4.2 Open-Collector Method; 5.5 Extraction Method of Extrinsic Resistance
5.5.1 Z Parameter Method5.5.2 Cold-HBT Method; 5.5.3 Open-Collector Method; 5.6 Extraction Method of Intrinsic Resistance; 5.6.1 Direct Extraction Method; 5.6.2 Hybrid Method; 5.7 Semianalysis Method; 5.8 Summary; References; Chapter 6 Large-Signal Equivalent Circuit Modeling of HBT; 6.1 Linear and Nonlinear; 6.1.1 Definition; 6.1.2 Nonlinear Lumped Elements; 6.2 Large Signal and Small Signal; 6.3 Thermal Resistance; 6.3.1 Definition; 6.3.2 Equivalent Circuit Model; 6.3.3 Determination of Thermal Resistance; 6.4 Nonlinear HBT Modeling; 6.4.1 VBIC Model; 6.4.2 Agilent Model
6.4.3 Macromodeling Method
Record Nr. UNINA-9910140452403321
Gao Jianjun <1968->  
Singapore : , : John Wiley and Sons, Incorporated, , 2015
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Heterojunction bipolar transistors for circuit design : microwave modelling and parameter extraction / / Jianjun Gao
Heterojunction bipolar transistors for circuit design : microwave modelling and parameter extraction / / Jianjun Gao
Autore Gao Jianjun <1968->
Pubbl/distr/stampa Singapore : , : John Wiley and Sons, Incorporated, , 2015
Descrizione fisica 1 online resource (278 p.)
Disciplina 621.3815/28
Soggetto topico Bipolar transistors
Heterojunctions
Electronic circuit design
Microwave measurements
ISBN 1-118-92153-4
1-118-92155-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Title Page; Copyright Page; Contents; About the Author; Preface; Acknowledgments; Nomenclature; Chapter 1 Introduction; 1.1 Overview of Heterojunction Bipolar Transistors; 1.2 Modeling and Measurement for HBT; 1.3 Organization of This Book; References; Chapter 2 Basic Concept of Microwave Device Modeling; 2.1 Signal Parameters; 2.1.1 Low-Frequency Parameters; 2.1.2 S-Parameters; 2.2 Representation of Noisy Two-Port Network; 2.2.1 Noise Matrix; 2.2.2 Noise Parameters; 2.3 Basic Circuit Elements; 2.3.1 Resistance; 2.3.2 Capacitance; 2.3.3 Inductance; 2.3.4 Controlled Sources
2.3.5 Ideal Transmission Line2.4 π- and T-Type Networks; 2.4.1 T-Type Network; 2.4.2 π-Type Network; 2.4.3 Relationship between π- and T-Type Networks; 2.5 Deembedding Method; 2.5.1 Parallel Deembedding; 2.5.2 Series Deembedding; 2.5.3 Cascading Deembedding; 2.6 Basic Methods of Parameter Extraction; 2.6.1 Determination of Capacitance; 2.6.2 Determination of Inductance; 2.6.3 Determination of Resistance; 2.7 Summary; References; Chapter 3 Modeling and Parameter Extraction Methods of Bipolar Junction Transistor; 3.1 PN Junction; 3.2 PN Junction Diode; 3.2.1 Basic Concept
3.2.2 Equivalent Circuit Model3.2.3 Determination of Model Parameters; 3.3 BJT Physical Operation; 3.3.1 Device Structure; 3.3.2 The Modes of Operation; 3.3.3 Base-Width Modulation; 3.3.4 High Injection and Current Crowding; 3.4 Equivalent Circuit Model; 3.4.1 E-M Model; 3.4.2 G-P Model; 3.4.3 Noise Model; 3.5 Microwave Performance; 3.5.1 Transition Frequency; 3.5.2 Common-Emitter Configuration; 3.5.3 Common-Base Configuration; 3.5.4 Common-Collector Configuration; 3.5.5 Summary and Comparisons; 3.6 Summary; References; Chapter 4 Basic Principle of HBT; 4.1 Semiconductor Heterojunction
4.2 HBT Device4.2.1 GaAs HBT; 4.2.2 InP HBT; 4.3 Summary; References; Chapter 5 Small-Signal Modeling and Parameter Extraction of HBT; 5.1 Small-Signal Circuit Model; 5.1.1 Pad Structure; 5.1.2 T-Type Circuit Model; 5.1.3 π-Type Circuit Model; 5.1.4 Unilateral Power Gain; 5.1.5 fT and fmax; 5.2 HBT Device Structure; 5.3 Extraction Method of PAD Capacitances; 5.3.1 Open Test Structure Method; 5.3.2 Pinch-Off Method; 5.4 Extraction Method of Extrinsic Inductances; 5.4.1 Short Test Structure Method; 5.4.2 Open-Collector Method; 5.5 Extraction Method of Extrinsic Resistance
5.5.1 Z Parameter Method5.5.2 Cold-HBT Method; 5.5.3 Open-Collector Method; 5.6 Extraction Method of Intrinsic Resistance; 5.6.1 Direct Extraction Method; 5.6.2 Hybrid Method; 5.7 Semianalysis Method; 5.8 Summary; References; Chapter 6 Large-Signal Equivalent Circuit Modeling of HBT; 6.1 Linear and Nonlinear; 6.1.1 Definition; 6.1.2 Nonlinear Lumped Elements; 6.2 Large Signal and Small Signal; 6.3 Thermal Resistance; 6.3.1 Definition; 6.3.2 Equivalent Circuit Model; 6.3.3 Determination of Thermal Resistance; 6.4 Nonlinear HBT Modeling; 6.4.1 VBIC Model; 6.4.2 Agilent Model
6.4.3 Macromodeling Method
Record Nr. UNINA-9910822337003321
Gao Jianjun <1968->  
Singapore : , : John Wiley and Sons, Incorporated, , 2015
Materiale a stampa
Lo trovi qui: Univ. Federico II
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High performance multi-channel high-speed I/O circuits / / Taehyoun Oh, Ramesh Harjani
High performance multi-channel high-speed I/O circuits / / Taehyoun Oh, Ramesh Harjani
Autore Oh Taehyoun
Edizione [1st ed. 2014.]
Pubbl/distr/stampa New York : , : Springer, , 2014
Descrizione fisica 1 online resource (x, 89 pages) : illustrations (some color)
Disciplina 621.3822
Collana Analog Circuits and Signal Processing
Soggetto topico Signal processing
Electronic circuit design
Electromagnetic interference - Prevention
Crosstalk - Prevention
ISBN 1-4614-4963-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction -- 2x6 Gb/s MIMO Crosstalk Cancellation and Signal Reutilization Scheme in 130 nm CMOS Process -- 4x12 Gb/s MIMO Crosstalk Cancellation and Signal Reutilization Receiver in 65 nm CMOS Process -- Adaptive XTCR, AGC, and Adaptive DFE Loop -- Research Summary & Contributions -- References -- Appendix A: Noise Analysis -- Appendix B: Issues of Applying Consecutive 2x2 XTCR on Multi-Lane I/Os (≥ 4) -- Appendix C: Transmitter-Side Discrete-Time FIR XTC Filter versus Receiver-Side Analog-IIR XTC Filter -- Appendix D: Line Mismatch Sensitivity -- Appendix E: Input Matching for 4x4 XTCR Receiver Test Bench -- Appendix F: Bandwidth Improvement by Technology Scaling.
Record Nr. UNINA-9910299745103321
Oh Taehyoun  
New York : , : Springer, , 2014
Materiale a stampa
Lo trovi qui: Univ. Federico II
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