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Advanced phase-lock techniques / / James A. Crawford
| Advanced phase-lock techniques / / James A. Crawford |
| Autore | Crawford James A. |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , ©2007 |
| Descrizione fisica | 1 online resource (533 p.) |
| Disciplina | 621.3815/364 |
| Collana | Artech House microwave library |
| Soggetto topico | Phase-locked loops |
| ISBN | 1-59693-141-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Preface; CHAPTER 1 Phase-Locked Systems--A High-Level Perspective; 1.1 PHASE-LOCKED LOOP BASICS; 1.2 CONTINUOUS-TIME CONTROL SYSTEM PERSPECTIVE FOR PLLS (HIGH SNR); 1.3 TIME-SAMPLED PLL SYSTEMS (HIGH SNR); 1.4 ESTIMATION THEORETIC PERSPECTIVE (LOW SNR) FOR PLLS; 1.5 SUMMARY; References; CHAPTER 2 Design Notes; 2.1 SUMMARY OF CLASSIC CONTINUOUS-TIME TYPE-2 SECOND-ORDER PLL DESIGN EQUATIONS; 2.2 CONTINUOUS-TIME TYPE-2 FOURTH-ORDER PLLS; 2.3 DISCRETIZED PLLS; 2.4 HYBRID PLLS INCORPORATING SAMPLE-AND-HOLDS; 2.5 COMMUNICATION THEORY; 2.6 SPECTRAL RELATIONSHIPS; 2.7 TRIGONOMETRY.
2.8 LAPLACE TRANSFORMS2.9 Z-TRANSFORMS; 2.10 PROBABILITY AND STOCHASTIC PROCESSES; 2.11 NUMERICAL SIMULATION; 2.12 CALCULUS; 2.13 BUTTERWORTH LOWPASS FILTERS; 2.14 CHEBYSHEV LOWPASS FILTERS; 2.15 CONSTANTS; References; CHAPTER 3 Fundamental Limits; 3.1 PHASE MODULATION AND BESSEL FUNCTIONS; 3.2 HILBERT TRANSFORMS; 3.3 CAUCHY-SCHWARZ INEQUALITY; 3.4 RF FILTERING EFFECTS ON FREQUENCY STABILITY; 3.5 CHEBYSHEV INEQUALITY; 3.6 CHERNOFF BOUND; 3.7 CRAMER-RAO BOUND; 3.8 EIGENFILTERS (OPTIMAL FILTERS); 3.9 FANO BROADBAND MATCHING THEOREM; 3.10 LEESON-SCHERER PHASE NOISE MODEL. 3.11 THERMAL NOISE LIMITS3.12 NYQUIST SAMPLING THEOREM; 3.13 PALEY-WIENER CRITERION; 3.14 PARSEVAL'S THEOREM; 3.15 POISSON SUM; 3.16 TIME-BANDWIDTH PRODUCT; 3.17 MATCHED-FILTERS FOR DETERMINISTIC SIGNALS IN ADDITIVE WHITE GAUSSIAN NOISE (AWGN); 3.18 WEAK LAW OF LARGE NUMBERS; References; Appendix 3A: Maximum-Likelihood Frequency Estimator; Appendix 3B: Phase Probability Density Function for Sine Wave in AWGN; CHAPTER 4 Noise in PLL-Based Systems; 4.1 INTRODUCTION; 4.2 SOURCES OF NOISE; 4.3 POWER SPECTRAL DENSITY CONCEPT FOR CONTINUOUS-TIME STOCHASTIC SIGNALS. 4.4 POWER SPECTRAL DENSITY FOR DISCRETE-TIME SAMPLED SYSTEMS4.5 PHASE NOISE FIRST PRINCIPLES; 4.6 RANDOM PHASE NOISE; 4.7 NOISE IMPRESSION ON TIME AND FREQUENCY SOURCES; References; Appendix 4A: Review of Stochastic Random Processes; Appendix 4B: Accurate Noise Modeling for Computer Simulations; Appendix 4C: Creating Arbitrary Noise Spectra in a Digital Signal Processing Environment; Appendix 4D: Noise in Direct Digital Synthesizers; CHAPTER 5 System Performance; 5.1 SYSTEM PERFORMANCE OVERVIEW; 5.2 INTEGRATED PHASE NOISE; 5.3 LOCAL OSCILLATORS FOR RECEIVE SYSTEMS. 5.4 LOCAL OSCILLATORS FOR TRANSMIT SYSTEMS5.5 LOCAL OSCILLATOR PHASE NOISE IMPACT ON DIGITAL COMMUNICATION ERROR RATE PERFORMANCE; 5.6 PHASE NOISE EFFECTS ON OFDM SYSTEMS; 5.7 PHASE NOISE EFFECTS ON SPREAD-SPECTRUM SYSTEMS; 5.8 PHASE NOISE IMPACT FOR MORE ADVANCED MODULATION WAVEFORMS; 5.9 CLOCK NOISE IMPACT ON DAC PERFORMANCE; 5.10 CLOCK NOISE IMPACT ON ADC PERFORMANCE; References; Appendix 5A: Image Suppression and Error Vector Magnitude; Appendix 5B: Channel Capacity and Cutoff Rate; CHAPTER 6 Fundamental Concepts for Continuous-Time Systems; 6.1 CONTINUOUS VERSUS DISCRETE TIME. |
| Record Nr. | UNINA-9910780748303321 |
Crawford James A.
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| Norwood, Massachusetts : , : Artech House, , ©2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Advanced phase-lock techniques / / James A. Crawford
| Advanced phase-lock techniques / / James A. Crawford |
| Autore | Crawford James A. |
| Pubbl/distr/stampa | Norwood, Massachusetts : , : Artech House, , ©2007 |
| Descrizione fisica | 1 online resource (533 p.) |
| Disciplina | 621.3815/364 |
| Collana | Artech House microwave library |
| Soggetto topico | Phase-locked loops |
| ISBN | 1-59693-141-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Preface; CHAPTER 1 Phase-Locked Systems--A High-Level Perspective; 1.1 PHASE-LOCKED LOOP BASICS; 1.2 CONTINUOUS-TIME CONTROL SYSTEM PERSPECTIVE FOR PLLS (HIGH SNR); 1.3 TIME-SAMPLED PLL SYSTEMS (HIGH SNR); 1.4 ESTIMATION THEORETIC PERSPECTIVE (LOW SNR) FOR PLLS; 1.5 SUMMARY; References; CHAPTER 2 Design Notes; 2.1 SUMMARY OF CLASSIC CONTINUOUS-TIME TYPE-2 SECOND-ORDER PLL DESIGN EQUATIONS; 2.2 CONTINUOUS-TIME TYPE-2 FOURTH-ORDER PLLS; 2.3 DISCRETIZED PLLS; 2.4 HYBRID PLLS INCORPORATING SAMPLE-AND-HOLDS; 2.5 COMMUNICATION THEORY; 2.6 SPECTRAL RELATIONSHIPS; 2.7 TRIGONOMETRY.
2.8 LAPLACE TRANSFORMS2.9 Z-TRANSFORMS; 2.10 PROBABILITY AND STOCHASTIC PROCESSES; 2.11 NUMERICAL SIMULATION; 2.12 CALCULUS; 2.13 BUTTERWORTH LOWPASS FILTERS; 2.14 CHEBYSHEV LOWPASS FILTERS; 2.15 CONSTANTS; References; CHAPTER 3 Fundamental Limits; 3.1 PHASE MODULATION AND BESSEL FUNCTIONS; 3.2 HILBERT TRANSFORMS; 3.3 CAUCHY-SCHWARZ INEQUALITY; 3.4 RF FILTERING EFFECTS ON FREQUENCY STABILITY; 3.5 CHEBYSHEV INEQUALITY; 3.6 CHERNOFF BOUND; 3.7 CRAMER-RAO BOUND; 3.8 EIGENFILTERS (OPTIMAL FILTERS); 3.9 FANO BROADBAND MATCHING THEOREM; 3.10 LEESON-SCHERER PHASE NOISE MODEL. 3.11 THERMAL NOISE LIMITS3.12 NYQUIST SAMPLING THEOREM; 3.13 PALEY-WIENER CRITERION; 3.14 PARSEVAL'S THEOREM; 3.15 POISSON SUM; 3.16 TIME-BANDWIDTH PRODUCT; 3.17 MATCHED-FILTERS FOR DETERMINISTIC SIGNALS IN ADDITIVE WHITE GAUSSIAN NOISE (AWGN); 3.18 WEAK LAW OF LARGE NUMBERS; References; Appendix 3A: Maximum-Likelihood Frequency Estimator; Appendix 3B: Phase Probability Density Function for Sine Wave in AWGN; CHAPTER 4 Noise in PLL-Based Systems; 4.1 INTRODUCTION; 4.2 SOURCES OF NOISE; 4.3 POWER SPECTRAL DENSITY CONCEPT FOR CONTINUOUS-TIME STOCHASTIC SIGNALS. 4.4 POWER SPECTRAL DENSITY FOR DISCRETE-TIME SAMPLED SYSTEMS4.5 PHASE NOISE FIRST PRINCIPLES; 4.6 RANDOM PHASE NOISE; 4.7 NOISE IMPRESSION ON TIME AND FREQUENCY SOURCES; References; Appendix 4A: Review of Stochastic Random Processes; Appendix 4B: Accurate Noise Modeling for Computer Simulations; Appendix 4C: Creating Arbitrary Noise Spectra in a Digital Signal Processing Environment; Appendix 4D: Noise in Direct Digital Synthesizers; CHAPTER 5 System Performance; 5.1 SYSTEM PERFORMANCE OVERVIEW; 5.2 INTEGRATED PHASE NOISE; 5.3 LOCAL OSCILLATORS FOR RECEIVE SYSTEMS. 5.4 LOCAL OSCILLATORS FOR TRANSMIT SYSTEMS5.5 LOCAL OSCILLATOR PHASE NOISE IMPACT ON DIGITAL COMMUNICATION ERROR RATE PERFORMANCE; 5.6 PHASE NOISE EFFECTS ON OFDM SYSTEMS; 5.7 PHASE NOISE EFFECTS ON SPREAD-SPECTRUM SYSTEMS; 5.8 PHASE NOISE IMPACT FOR MORE ADVANCED MODULATION WAVEFORMS; 5.9 CLOCK NOISE IMPACT ON DAC PERFORMANCE; 5.10 CLOCK NOISE IMPACT ON ADC PERFORMANCE; References; Appendix 5A: Image Suppression and Error Vector Magnitude; Appendix 5B: Channel Capacity and Cutoff Rate; CHAPTER 6 Fundamental Concepts for Continuous-Time Systems; 6.1 CONTINUOUS VERSUS DISCRETE TIME. |
| Record Nr. | UNINA-9910819842003321 |
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Crawford James A.
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| Norwood, Massachusetts : , : Artech House, , ©2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt
| Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
| Autore | Kelly Joe, Ph. D. |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
| Descrizione fisica | 1 online resource (325 p.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | EngelhardtM (Michael) |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-58053-710-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
| Record Nr. | UNINA-9910450916503321 |
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Kelly Joe, Ph. D.
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| Boston : , : Artech House, , ©2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt
| Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
| Autore | Kelly Joe, Ph. D. |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
| Descrizione fisica | 1 online resource (325 p.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | EngelhardtM (Michael) |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
| ISBN | 1-58053-710-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
| Record Nr. | UNINA-9910777033903321 |
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Kelly Joe, Ph. D.
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||
| Boston : , : Artech House, , ©2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt
| Advanced production testing of RF, SoC, and SiP devices / / Joe Kelly, Michael Engelhardt |
| Autore | Kelly Joe, Ph. D. |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2007 |
| Descrizione fisica | 1 online resource (325 p.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | EngelhardtM (Michael) |
| Collana | Artech House microwave library |
| Soggetto topico |
Systems on a chip - Testing
Embedded computer systems |
| ISBN | 1-58053-710-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265
Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 |
| Record Nr. | UNINA-9910807375803321 |
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Kelly Joe, Ph. D.
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| Boston : , : Artech House, , ©2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced semiconductor device physics and modeling / Juin J. Liou
| Advanced semiconductor device physics and modeling / Juin J. Liou |
| Autore | Liou, Juin J. |
| Pubbl/distr/stampa | Boston ; London : Artech House, ©1994 |
| Descrizione fisica | 498 p. : ill. ; 24 cm |
| Disciplina | 621.381'52 |
| Collana | The Artech House materials science library |
| Soggetto non controllato | Semiconduttori |
| ISBN | 0890066965 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-990009126740403321 |
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Liou, Juin J.
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| Boston ; London : Artech House, ©1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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The advanced smart grid : edge power driving sustainability / / Andres Carvallo, John Cooper
| The advanced smart grid : edge power driving sustainability / / Andres Carvallo, John Cooper |
| Autore | Carvallo Andres |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2011 |
| Descrizione fisica | 268 pages |
| Disciplina | 621.319 |
| Altri autori (Persone) | CooperJohn |
| Soggetto topico | Electric power distribution - Automation |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-60807-128-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The inevitable emergence of the smart grid -- The rationale for an advanced smart grid -- Smart convergence -- Smart grid 1.0 emerges -- Envisioning and designing smart grid 2.0 -- Today's smart grid -- Fast-forward to smart grid 3.0. |
| Record Nr. | UNINA-9910461738003321 |
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Carvallo Andres
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| Boston : , : Artech House, , ©2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The advanced smart grid : edge power driving sustainability / / Andres Carvallo, John Cooper
| The advanced smart grid : edge power driving sustainability / / Andres Carvallo, John Cooper |
| Autore | Carvallo Andres |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2011 |
| Descrizione fisica | 268 pages |
| Disciplina | 621.319 |
| Altri autori (Persone) | CooperJohn |
| Soggetto topico | Electric power distribution - Automation |
| ISBN | 1-60807-128-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The inevitable emergence of the smart grid -- The rationale for an advanced smart grid -- Smart convergence -- Smart grid 1.0 emerges -- Envisioning and designing smart grid 2.0 -- Today's smart grid -- Fast-forward to smart grid 3.0. |
| Record Nr. | UNINA-9910789749603321 |
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Carvallo Andres
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||
| Boston : , : Artech House, , ©2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The advanced smart grid : edge power driving sustainability / / Andres Carvallo, John Cooper
| The advanced smart grid : edge power driving sustainability / / Andres Carvallo, John Cooper |
| Autore | Carvallo Andres |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2011 |
| Descrizione fisica | 268 pages |
| Disciplina | 621.319 |
| Altri autori (Persone) | CooperJohn |
| Soggetto topico | Electric power distribution - Automation |
| ISBN | 1-60807-128-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The inevitable emergence of the smart grid -- The rationale for an advanced smart grid -- Smart convergence -- Smart grid 1.0 emerges -- Envisioning and designing smart grid 2.0 -- Today's smart grid -- Fast-forward to smart grid 3.0. |
| Record Nr. | UNINA-9910819587903321 |
|
Carvallo Andres
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| Boston : , : Artech House, , ©2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced standard SQL dynamic structured data modeling and hierarchical processing / / Michael M. David, Lee Fesperman
| Advanced standard SQL dynamic structured data modeling and hierarchical processing / / Michael M. David, Lee Fesperman |
| Autore | David Michael M. |
| Pubbl/distr/stampa | Boston : , : Artech House, , ©2013 |
| Descrizione fisica | 1 online resource (406 p.) |
| Disciplina | 005.7565 |
| Altri autori (Persone) |
FespermanLee
DavidMichael M |
| Collana | Artech House computing library |
| Soggetto topico |
SQL (Computer program language)
Data structures (Computer science) |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-60807-534-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Advanced Standard SQL Dynamic Structured Data Modeling and Hierarchical Processing; Contents; Preface; Introduction; Part I: The Basics of the RelationalJoin Operation; 1 Relational Join Introduction; 1.1 Standard Inner Join Review; 1.2 Problems with Relational Join Processing; 1.3 Outer Join Review; 1.4 Problems with Previous Outer Join Syntax; 1.5 Conclusion; 2 The Standard SQL Join Operation; 2.1 Standard SQL Join Syntax; 2.2 Standard SQL Join Operation; 2.3 Standard SQL Join Does Not Follow the Cartesian Product Model; 2.4 Determining Standard SQL Join Associativity and Commutativity.
2.5 What Outer Join Commutativity Is2.6 What Outer Join Associativity Is; 2.7 Hierarchictivity in Addition to Associativity and Commutativity; 2.8 Conclusion; 3 Standard SQL Join Types and Their Operation; 3.1 FULL Outer Join; 3.2 One-Sided Outer Join; 3.3 INNER Join; 3.4 CROSS Join; 3.5 UNION Join; 3.6 Intermixing Join Types; 3.7 Conclusion; 64. |
| Record Nr. | UNINA-9910465334403321 |
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David Michael M.
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| Boston : , : Artech House, , ©2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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