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MEMS 2002 : the Fifteenth IEEE International Conference on Micro Electro Mechanical Systems : technical digest : Las Vegas, Nevada, USA, January 20-24, 2002
| MEMS 2002 : the Fifteenth IEEE International Conference on Micro Electro Mechanical Systems : technical digest : Las Vegas, Nevada, USA, January 20-24, 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2002 |
| Disciplina | 621.381 |
| Soggetto topico |
Microelectromechanical systems
Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996217697703316 |
| [Place of publication not identified], : IEEE, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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MEMS 2003 : IEEE the Sixteenth Annual International Conference on Micro Electro Mechanical Systems : Kyoto, Japan, January 19-23, 2003
| MEMS 2003 : IEEE the Sixteenth Annual International Conference on Micro Electro Mechanical Systems : Kyoto, Japan, January 19-23, 2003 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2003 |
| Disciplina | 621.381 |
| Soggetto topico |
Microelectromechanical systems
Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996210047803316 |
| [Place of publication not identified], : IEEE, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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MEMS 2005 Miami : 18th IEEE International Conference on Micro Electro Mechanical Systems : technical digest : Miami Beach, Florida, USA, January 30-February 3, 2005
| MEMS 2005 Miami : 18th IEEE International Conference on Micro Electro Mechanical Systems : technical digest : Miami Beach, Florida, USA, January 30-February 3, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2005 |
| Disciplina | 621.381 |
| Soggetto topico |
Microelectromechanical systems
Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9755-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146477203321 |
| [Place of publication not identified], : IEEE, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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MEMS 2005 Miami : 18th IEEE International Conference on Micro Electro Mechanical Systems : technical digest : Miami Beach, Florida, USA, January 30-February 3, 2005
| MEMS 2005 Miami : 18th IEEE International Conference on Micro Electro Mechanical Systems : technical digest : Miami Beach, Florida, USA, January 30-February 3, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2005 |
| Disciplina | 621.381 |
| Soggetto topico |
Microelectromechanical systems
Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9755-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204498003316 |
| [Place of publication not identified], : IEEE, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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MEMS 2015 : the 28th International Conference on Micro Electro Mechanical Systems : 18-22 January 2015, Estoril, Portugal / / sponsored by IEEE
| MEMS 2015 : the 28th International Conference on Micro Electro Mechanical Systems : 18-22 January 2015, Estoril, Portugal / / sponsored by IEEE |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 |
| Descrizione fisica | 1 online resource (927 pages) |
| Disciplina | 621.381 |
| Soggetto topico | Microelectromechanical systems |
| ISBN | 1-4799-7955-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | [v. 1.] Pages 1-568 -- [v. 2.] Pages 569-1148 |
| Record Nr. | UNINA-9910135185003321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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MEMS 2015 : the 28th International Conference on Micro Electro Mechanical Systems : 18-22 January 2015, Estoril, Portugal / / sponsored by IEEE
| MEMS 2015 : the 28th International Conference on Micro Electro Mechanical Systems : 18-22 January 2015, Estoril, Portugal / / sponsored by IEEE |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 |
| Descrizione fisica | 1 online resource (927 pages) |
| Disciplina | 621.381 |
| Soggetto topico | Microelectromechanical systems |
| ISBN | 1-4799-7955-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | [v. 1.] Pages 1-568 -- [v. 2.] Pages 569-1148 |
| Record Nr. | UNISA-996280303703316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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MEMS and Microfluidic Devices for Analytical Chemistry and Biosensing / / edited by Stefano Zampolli
| MEMS and Microfluidic Devices for Analytical Chemistry and Biosensing / / edited by Stefano Zampolli |
| Pubbl/distr/stampa | Basel, Switzerland : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2023 |
| Descrizione fisica | 1 online resource (104 pages) |
| Disciplina | 621.381 |
| Soggetto topico |
Microfluidics
Microelectromechanical systems |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910729789203321 |
| Basel, Switzerland : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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MEMS and MOEMS : technology and applications / P. Rai-Choudhury editor
| MEMS and MOEMS : technology and applications / P. Rai-Choudhury editor |
| Pubbl/distr/stampa | Bellingham, : SPIE, c2000 |
| Descrizione fisica | XI, 520 p. : ill. ; 26 cm. |
| Disciplina | 621.381 |
| Collana | SPIE press monograph |
| Soggetto topico | Elettronica |
| ISBN | 0819437166 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Microelectromechanical systems and micro-optoelectromechanical systems |
| Record Nr. | UNISANNIO-MIL0499700 |
| Bellingham, : SPIE, c2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Sannio | ||
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MEMS and Nanotechnology, Volume 5 [[electronic resource] ] : Proceedings of the 2013 Annual Conference on Experimental and Applied Mechanics / / edited by Gordon Shaw III, Barton C. Prorok, LaVern Starman, Cosme Furlong
| MEMS and Nanotechnology, Volume 5 [[electronic resource] ] : Proceedings of the 2013 Annual Conference on Experimental and Applied Mechanics / / edited by Gordon Shaw III, Barton C. Prorok, LaVern Starman, Cosme Furlong |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 |
| Descrizione fisica | 1 online resource (135 p.) |
| Disciplina | 621.381 |
| Collana | Conference Proceedings of the Society for Experimental Mechanics Series |
| Soggetto topico |
Nanotechnology
Mechanics Mechanics, Applied Nanotechnology and Microengineering Theoretical and Applied Mechanics |
| ISBN | 3-319-00780-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | From the Contents: Warpage Measurement of Simulated Electronic Packaging Assembly -- Nanomechanical Characterization of Lead Free Solder Joints -- In-Situ Surface Mount Process Characterization Using Digital Image Correlation -- Acoustic Waveform Energy as an Interconnect Damage Indicator -- Shape Optimization of Cantilevered Piezoelectric Devices -- Unique Fabrication Method for Novel MEMS Micro-contact Structure -- A Frequency Selective Surface Design Fabricated With Tunable RF Meta-atoms -- Stress Characterization in Si/SiO2 Spherical Shells Used in Micro-Robotics. |
| Record Nr. | UNINA-9910299488903321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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MEMS and Nanotechnology, Volume 6 [[electronic resource] ] : Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics / / edited by Gordon A. Shaw, Barton C. Prorok, LaVern A. Starman
| MEMS and Nanotechnology, Volume 6 [[electronic resource] ] : Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics / / edited by Gordon A. Shaw, Barton C. Prorok, LaVern A. Starman |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | New York, NY : , : Springer New York : , : Imprint : Springer, , 2013 |
| Descrizione fisica | 1 online resource (155 p.) |
| Disciplina | 621.381 |
| Collana | Conference Proceedings of the Society for Experimental Mechanics Series |
| Soggetto topico |
Nanotechnology
Mechanics Mechanics, Applied Nanotechnology and Microengineering Theoretical and Applied Mechanics |
| ISBN |
1-283-62411-7
9786613936561 1-4614-4436-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | From the Contents: Silicon Carbide High Temperature MEMS Capacitive Strain Sensor -- Characterizing External Resistive, Inductive and Capacitive Loads for Micro-switches -- KEYNOTE: Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules -- KEYNOTE: Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-atom Chain Using Photon-momentum-based Force Calibration -- A Precision Force Microscope for Biophysics -- DNA Molecular Recognition Using AFM Nanometrology -- Hydrodynamic Force Compensation for Single-molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy -- New Insight into Pile-Up in Thin Film Indentation. |
| Record Nr. | UNINA-9910437917303321 |
| New York, NY : , : Springer New York : , : Imprint : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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