top

  Info

  • Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.

  Info

  • Utilizzare questo link per rimuovere la selezione effettuata.

Biblioteca

MARC Lista (tabellare)
HPHT-Treated Diamonds [[electronic resource] ] : Diamonds Forever / / by Inga A. Dobrinets, Victor. G. Vins, Alexander M. Zaitsev
HPHT-Treated Diamonds [[electronic resource] ] : Diamonds Forever / / by Inga A. Dobrinets, Victor. G. Vins, Alexander M. Zaitsev
Autore Dobrinets Inga A
Edizione [1st ed. 2013.]
Pubbl/distr/stampa Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013
Descrizione fisica 1 online resource (270 p.)
Disciplina 548
Collana Springer Series in Materials Science
Soggetto topico Crystallography
Optical materials
Electronic materials
Physical chemistry
Materials science
Spectroscopy
Microscopy
Crystallography and Scattering Methods
Optical and Electronic Materials
Physical Chemistry
Characterization and Evaluation of Materials
Spectroscopy and Microscopy
ISBN 3-642-37490-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Natural Diamonds Used for HPHT Treatment -- Process of HPHT Treatment -- Features of HPHT Treated Diamonds -- Recognition of HPHT Treated Diamonds -- Concluding Remarks: Diamond Treatment is a Never-Ending Story.
Record Nr. UNINA-9910438108503321
Dobrinets Inga A  
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Hydrogen Bonded Supramolecular Structures / editors Zhan-Ting Li, Li-Zhu Wu
Hydrogen Bonded Supramolecular Structures / editors Zhan-Ting Li, Li-Zhu Wu
Pubbl/distr/stampa Heidelberg, : Springer, 2015
Descrizione fisica XI, 350 p. : ill. ; 24 cm
Disciplina 540(Chimica generale)
547(Chimica organica)
548(Cristallografia)
620.192(Polimeri)
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNICAMPANIA-VAN0242734
Heidelberg, : Springer, 2015
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Imperfections in crystals / H. G. van Bueren
Imperfections in crystals / H. G. van Bueren
Autore Bueren, H. G. van
Pubbl/distr/stampa Amsterdam : North-Holland publishing company, 1960
Descrizione fisica XVIII, 676 p. : ill. ; 23 cm
Disciplina 548
Soggetto non controllato Fisica
Cristalli
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione ita
Record Nr. UNINA-990000026530403321
Bueren, H. G. van
Amsterdam : North-Holland publishing company, 1960
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
IMPERFECTIONS in nearly perfect crystals Symposium at Pocono Manor, October 12-14, 1950. / Editorial Committee W. Shockley,J.H. Hollomon, R. Maurer, F. Seitz. Sponsored by the Committee on solids, Division of Physical Sciences, The National Research Council
IMPERFECTIONS in nearly perfect crystals Symposium at Pocono Manor, October 12-14, 1950. / Editorial Committee W. Shockley,J.H. Hollomon, R. Maurer, F. Seitz. Sponsored by the Committee on solids, Division of Physical Sciences, The National Research Council
Pubbl/distr/stampa New York : Wiley & Sons, 1952
Descrizione fisica IX,490 p., ill., 24 cm
Disciplina 548
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione ita
Record Nr. UNINA-990000324200403321
New York : Wiley & Sons, 1952
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Incommensurate crystals , liquid crystals , and quasi- crystals / edited by J. F. Scott and N. A. Clark
Incommensurate crystals , liquid crystals , and quasi- crystals / edited by J. F. Scott and N. A. Clark
Pubbl/distr/stampa New York and London : Plenum press, c1987
Descrizione fisica IX, 368 p. : ill. ; 26 cm
Disciplina 548
Collana NATO ASI series. Series B: Physics
Soggetto topico Cristalli - Congressi - 1986
Cristalli liquidi - Congressi - 1986
ISBN 0-306-42760-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-990000360840203316
New York and London : Plenum press, c1987
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Indexing of crystal diffraction patterns : from crystallography basics to methods of automatic indexing / / Adam Morawiec
Indexing of crystal diffraction patterns : from crystallography basics to methods of automatic indexing / / Adam Morawiec
Autore Morawiec Adam
Pubbl/distr/stampa Cham, Switzerland : , : Springer, , [2022]
Descrizione fisica 1 online resource (427 pages)
Disciplina 548
Collana Springer Series in Materials Science
Soggetto topico Crystallography
Molecular structure
ISBN 9783031110771
9783031110764
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro -- Preface -- Contents -- Preliminaries -- Points and Vectors in Space -- Index Notation -- List of Selected Symbols -- NIST Values of Physical Constants -- 1 Elements of Geometric Crystallography -- 1.1 Linear Oblique Coordinate Systems -- 1.1.1 Component-free Tensor Notation -- 1.1.2 Frames-Overcomplete Sets of Vectors -- 1.2 Lattices -- 1.2.1 Lagrange-Gauss Reduction -- 1.2.2 Buerger- and Niggli-Reduced Bases -- 1.2.3 Delaunay Reduction -- 1.2.4 Sublattices and Superlattices -- 1.2.5 Centerings and Non-Primitive Lattice Cells -- 1.3 Crystal Symmetry Groups -- 1.3.1 Euclidean Group -- 1.3.2 Finite Point Groups -- 1.3.3 Crystallographic Point Groups -- 1.3.4 Space Groups -- 1.3.5 Crystal Systems -- 1.3.6 Bravais Types -- 1.3.7 Symmetry of the Reciprocal Lattice -- 1.3.8 Bravais Type from Niggli Character or Delaunay Sort -- 1.4 Conventional Crystallographic Settings -- 1.5 Indices of Directions and Planes -- 1.5.1 Direction and Miller Indices -- 1.5.2 Generalized Indices of Directions and Planes -- 1.6 Families of Equivalent Stacks of Planes -- 1.7 Comparison of Lattices and Bravais-class Determination -- 1.7.1 Lattice Symmetry from Distribution of Two-fold Axes -- 1.7.2 Method Based on Metric Tensor -- 1.8 Crystal Orientation -- 1.9 Homogeneous Strain -- 1.9.1 Change of Lattice Metric -- 1.9.2 Effect of Lattice Transformation on Its Reciprocal Lattice -- 1.9.3 Strain Tensor in the Crystal Reference System -- 1.9.4 Strain Tensor in Cartesian Reference System -- 1.10 Lattice and Fourier Transformation -- 1.11 Appendix: Fourier Transformation -- 1.11.1 Fourier Series and Fourier Transformation -- 1.11.2 Distributions -- 1.11.3 Convolution -- 1.11.4 Fourier Transform of Dirac Comb -- 1.11.5 Projection-Slice Theorem -- References -- 2 Basic Aspects of Crystal Diffraction -- 2.1 Scattering of Waves in Solids -- 2.1.1 Coherence.
2.1.2 Diffraction Theories -- 2.2 Geometry of Crystal Diffraction -- 2.2.1 Laue Equation -- 2.2.2 Ewald Construction -- 2.2.3 Bragg's Law -- 2.3 Geometries of Selected Diffraction Techniques -- 2.3.1 X-ray Diffractometry -- 2.3.2 Planar Detector -- 2.3.3 Geometry of K-lines -- 2.3.4 Electron Spot Patterns -- 2.3.5 Geometry of Laue Patterns -- 2.4 Structure Factor -- 2.4.1 Introduction -- 2.4.2 X-ray Form Factors -- 2.4.3 Electron Atomic Scattering Factors -- 2.5 Formal Approach to Crystal Diffraction -- 2.5.1 Fourier Transform of the Transfer Function of an Unbounded Crystal -- 2.5.2 Crystal of Finite Dimensions -- 2.6 Intensities of Reflections -- 2.6.1 Systematic Absences -- 2.6.2 Friedel's Law -- 2.7 Other Factors Affecting Intensities -- 2.7.1 Absorption -- 2.7.2 Occupancy and Thermal Vibrations -- 2.8 Appendix: A Note on the Diffraction of Light -- 2.8.1 Pattern at the Focal Plane of a Converging Lens -- References -- 3 Diffraction of High Energy Electrons -- 3.1 Introduction to Dynamical Diffraction -- 3.1.1 Bloch Waves -- 3.2 Wave equation for a Single Electron in an Electrostatic Potential -- 3.2.1 Solutions for an Unbounded Crystal -- 3.2.2 Two-Beam Centro-Symmetric Case -- 3.3 Bloch Waves in Semi-Infinite and Plate-Like Crystals -- 3.4 Intensities on TEM Diffraction Patterns -- References -- 4 Cartesian Reference Frames in Diffractometry -- 4.1 X-ray Diffractometer -- 4.2 Crystal Orientation in Transmission Electron Microscope -- 4.2.1 Tilt Angles and Specimen Orientation -- 4.2.2 Crystal Orientation with Respect the Microscope Axis -- 4.2.3 Tilting a Crystal to a Given Zone Axis -- 4.2.4 Determination of `Magnetic' Rotation Angle -- 4.3 Orientation in Scanning Microscope -- References -- 5 Ab Initio Indexing of Single-Crystal Diffraction Patterns -- 5.1 Indexing in General -- 5.2 Ab Initio Indexing for Structure Determination.
5.3 Experimental Single-Crystal Techniques -- 5.4 The Problem of Indexing Single-Crystal Data -- 5.4.1 Basics -- 5.4.2 Indexing Error-Free Data -- 5.4.3 Impact of Errors -- 5.4.4 Some Objective Functions -- 5.5 Real-Space Indexing -- 5.5.1 Obtaining Test Vectors -- 5.5.2 Interpretations of t- .4 cdoth- .4 n -- 5.6 Period Detection -- 5.6.1 Domains -- 5.6.2 Test Periods -- 5.6.3 Period Determination Without Binning the Data -- 5.6.4 Folding -- 5.6.5 Correlations with Other Functions -- 5.6.6 One-Dimensional Fourier Transformation -- 5.6.7 Rayleigh Test -- 5.6.8 Lomb-Scargle Periodogram -- 5.6.9 Combining Various Techniques -- 5.7 Difference Vectors -- 5.8 Indexing via Three-Dimensional Fourier Transformation -- 5.9 Clustering in Reciprocal Space -- 5.10 Directions of Zone Axes from Difference Vectors -- 5.11 Constructing a Three-Dimensional Lattice -- 5.12 An Example Indexing Program Ind_X -- 5.12.1 Method -- 5.13 A Bird's Eye View on Ab Initio Indexing -- 5.14 Appendix: Auxiliary Tools -- 5.14.1 Obtaining the Scattering Vector from a Kossel Line -- 5.14.2 Linear Optimization Problem -- 5.14.3 Generation of Integer Triplets -- References -- 6 Ab-Inito Indexing of Laue Patterns -- 6.1 Geometry of Laue Patterns -- 6.1.1 Experimentally Accessible Part of the Reciprocal Space -- 6.2 Gnomonic Projection of Reciprocal Lattice Nodes -- 6.3 Gnomonic Projection of a Cell -- 6.4 Laue Indexing -- 6.4.1 Indexing Software -- 6.4.2 An Approach Referring to Direct Space -- 6.4.3 Getting Zone Axes via Integral Transforms -- 6.4.4 Fitting a Consistent Mesh -- 6.4.5 Indexing Limited to Reciprocal Space -- 6.4.6 Using Sextuplets of Points -- 6.4.7 Testing Superlattices -- 6.4.8 Indices of an Individual Reflection -- 6.4.9 Quality of Solution-Figure of Merit -- 6.5 Indexing of Pink-Beam Diffraction Patterns.
6.5.1 Algorithm for Fitting the Scaling Factor and Orders of Reflections -- References -- 7 Indexing of Powder Diffraction Patterns -- 7.1 Link Between Peaks Positions and Reflection Indices -- 7.2 Ambiguities -- 7.3 Figures of Merit -- 7.4 Indexing Procedures -- 7.4.1 Search in the Continuous Parameter Space -- 7.4.2 Search in the Discrete Index Space -- 7.4.3 Relationships Between Line Positions -- 7.4.4 Metric in Conventional Crystallographic Setting -- 7.4.5 Indexing Based on Complete Pattern -- 7.5 Integrated Software Packages -- References -- 8 Indexing for Crystal Orientation Determination -- 8.1 Orientation Mapping -- 8.2 Orientation via Pattern Indexing -- 8.2.1 Scattering Vectors and Reciprocal Lattice Vectors -- 8.2.2 Vector Magnitudes and Reflection Intensities -- 8.3 Formal Aspects of End-Indexing -- 8.3.1 Basic Relationships -- 8.3.2 Related Solvable Problems -- 8.3.3 Rotations Versus Proper Rotations -- 8.3.4 Computational Context -- 8.4 Spurious Scattering Vectors -- 8.4.1 Accumulation -- 8.5 Accumulation in Discrete Space -- 8.5.1 Triplet Voting -- 8.5.2 Example Implementation -- 8.6 Accumulation in Rotation Space -- 8.6.1 Accumulation at Points of the Rotation Space -- 8.6.2 Accumulation Along Curves in the Space of Rotations -- 8.6.3 Maxima in Rotation Space -- 8.6.4 Other Orientation-Based Algorithms -- 8.7 Testing of Indexing Algorithms -- 8.8 Figures of Merit and Other Issues -- 8.8.1 Three Remarks -- 8.9 Orientation Determination via Direct Pattern Matching -- 8.9.1 Direct Matching Limited by a Detected Reflection -- References -- 9 Indexing of Electron Spot-Type Diffraction Patterns -- 9.1 Conventional Indexing of Zone Axis Patterns -- 9.1.1 180°-Ambiguity -- 9.1.2 Computer-Assisted Conventional Indexing -- 9.2 Automatic Orientation Determination -- 9.2.1 Precession Electron Diffraction.
9.3 Three-Dimensional Ab Initio Indexing -- 9.3.1 Automatic Recording of Tilt Series -- 9.4 Note on Other TEM-Based Patterns -- References -- 10 Example Complications in Indexing -- 10.1 Pseudosymmetry -- 10.2 Indexing of `Multi-lattice' Diffraction Patterns -- 10.2.1 Twins -- 10.2.2 Types of Twins -- 10.2.3 Diffraction Patterns Originating From Twins -- 10.3 Ambiguities in Crystal Orientation Determination -- 10.4 Indexing of Satellite Reflections -- 10.4.1 Sinusoidally Commensurately Modulated One-Dimensional `Crystals' -- 10.4.2 Modulation Propagation Vector -- 10.4.3 Indexing -- 10.4.4 Incommensurately Modulated Structures -- 10.5 Non-Conventional Structure Determination Methods -- 10.5.1 Indexing Grazing-Incidence X-ray Diffraction Data -- 10.5.2 Serial Crystallography -- References -- 11 Multigrain Indexing -- 11.1 Three-Dimensional X-ray Diffraction -- 11.2 X-ray Diffraction Contrast Tomography -- 11.3 Processing of Diffraction Data -- 11.3.1 Location of a Diffraction Spot as a Function of Grain Position -- 11.3.2 Algebraic Reconstruction Technique -- 11.3.3 Friedel Pairs -- 11.3.4 Indexing and Reconstruction -- 11.4 Other Methods of Three-Dimensional Mapping -- 11.4.1 Laboratory X-ray Diffraction Contrast Tomography -- 11.4.2 Differential Aperture X-ray Microscopy -- 11.4.3 Three-Dimensional Orientation Mapping in TEM -- 11.4.4 Three-Dimensional Mapping Using Neutron Diffraction -- References -- 12 An Excursion Beyond Diffraction by Periodic Crystals -- 12.1 Debye Scattering Formula -- 12.2 Single-Particle Diffraction Imaging -- 12.2.1 Phase Problem -- 12.2.2 Iterative Phase Retrieval Algorithms -- 12.2.3 Single-Particle Imaging With XFEL -- 12.3 Indexing of Diffraction Patterns of Helical Structures -- 12.3.1 Helix -- 12.3.2 Helical Structure -- 12.3.3 Structure Factor -- 12.3.4 Selection Rule -- 12.3.5 Single-Wall Tubes.
12.3.6 Intensities in Layer Lines.
Record Nr. UNISA-996490350603316
Morawiec Adam  
Cham, Switzerland : , : Springer, , [2022]
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Indexing of crystal diffraction patterns : from crystallography basics to methods of automatic indexing / / Adam Morawiec
Indexing of crystal diffraction patterns : from crystallography basics to methods of automatic indexing / / Adam Morawiec
Autore Morawiec Adam
Pubbl/distr/stampa Cham, Switzerland : , : Springer, , [2022]
Descrizione fisica 1 online resource (427 pages)
Disciplina 548
Collana Springer Series in Materials Science
Soggetto topico Crystallography
Molecular structure
ISBN 9783031110771
9783031110764
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro -- Preface -- Contents -- Preliminaries -- Points and Vectors in Space -- Index Notation -- List of Selected Symbols -- NIST Values of Physical Constants -- 1 Elements of Geometric Crystallography -- 1.1 Linear Oblique Coordinate Systems -- 1.1.1 Component-free Tensor Notation -- 1.1.2 Frames-Overcomplete Sets of Vectors -- 1.2 Lattices -- 1.2.1 Lagrange-Gauss Reduction -- 1.2.2 Buerger- and Niggli-Reduced Bases -- 1.2.3 Delaunay Reduction -- 1.2.4 Sublattices and Superlattices -- 1.2.5 Centerings and Non-Primitive Lattice Cells -- 1.3 Crystal Symmetry Groups -- 1.3.1 Euclidean Group -- 1.3.2 Finite Point Groups -- 1.3.3 Crystallographic Point Groups -- 1.3.4 Space Groups -- 1.3.5 Crystal Systems -- 1.3.6 Bravais Types -- 1.3.7 Symmetry of the Reciprocal Lattice -- 1.3.8 Bravais Type from Niggli Character or Delaunay Sort -- 1.4 Conventional Crystallographic Settings -- 1.5 Indices of Directions and Planes -- 1.5.1 Direction and Miller Indices -- 1.5.2 Generalized Indices of Directions and Planes -- 1.6 Families of Equivalent Stacks of Planes -- 1.7 Comparison of Lattices and Bravais-class Determination -- 1.7.1 Lattice Symmetry from Distribution of Two-fold Axes -- 1.7.2 Method Based on Metric Tensor -- 1.8 Crystal Orientation -- 1.9 Homogeneous Strain -- 1.9.1 Change of Lattice Metric -- 1.9.2 Effect of Lattice Transformation on Its Reciprocal Lattice -- 1.9.3 Strain Tensor in the Crystal Reference System -- 1.9.4 Strain Tensor in Cartesian Reference System -- 1.10 Lattice and Fourier Transformation -- 1.11 Appendix: Fourier Transformation -- 1.11.1 Fourier Series and Fourier Transformation -- 1.11.2 Distributions -- 1.11.3 Convolution -- 1.11.4 Fourier Transform of Dirac Comb -- 1.11.5 Projection-Slice Theorem -- References -- 2 Basic Aspects of Crystal Diffraction -- 2.1 Scattering of Waves in Solids -- 2.1.1 Coherence.
2.1.2 Diffraction Theories -- 2.2 Geometry of Crystal Diffraction -- 2.2.1 Laue Equation -- 2.2.2 Ewald Construction -- 2.2.3 Bragg's Law -- 2.3 Geometries of Selected Diffraction Techniques -- 2.3.1 X-ray Diffractometry -- 2.3.2 Planar Detector -- 2.3.3 Geometry of K-lines -- 2.3.4 Electron Spot Patterns -- 2.3.5 Geometry of Laue Patterns -- 2.4 Structure Factor -- 2.4.1 Introduction -- 2.4.2 X-ray Form Factors -- 2.4.3 Electron Atomic Scattering Factors -- 2.5 Formal Approach to Crystal Diffraction -- 2.5.1 Fourier Transform of the Transfer Function of an Unbounded Crystal -- 2.5.2 Crystal of Finite Dimensions -- 2.6 Intensities of Reflections -- 2.6.1 Systematic Absences -- 2.6.2 Friedel's Law -- 2.7 Other Factors Affecting Intensities -- 2.7.1 Absorption -- 2.7.2 Occupancy and Thermal Vibrations -- 2.8 Appendix: A Note on the Diffraction of Light -- 2.8.1 Pattern at the Focal Plane of a Converging Lens -- References -- 3 Diffraction of High Energy Electrons -- 3.1 Introduction to Dynamical Diffraction -- 3.1.1 Bloch Waves -- 3.2 Wave equation for a Single Electron in an Electrostatic Potential -- 3.2.1 Solutions for an Unbounded Crystal -- 3.2.2 Two-Beam Centro-Symmetric Case -- 3.3 Bloch Waves in Semi-Infinite and Plate-Like Crystals -- 3.4 Intensities on TEM Diffraction Patterns -- References -- 4 Cartesian Reference Frames in Diffractometry -- 4.1 X-ray Diffractometer -- 4.2 Crystal Orientation in Transmission Electron Microscope -- 4.2.1 Tilt Angles and Specimen Orientation -- 4.2.2 Crystal Orientation with Respect the Microscope Axis -- 4.2.3 Tilting a Crystal to a Given Zone Axis -- 4.2.4 Determination of `Magnetic' Rotation Angle -- 4.3 Orientation in Scanning Microscope -- References -- 5 Ab Initio Indexing of Single-Crystal Diffraction Patterns -- 5.1 Indexing in General -- 5.2 Ab Initio Indexing for Structure Determination.
5.3 Experimental Single-Crystal Techniques -- 5.4 The Problem of Indexing Single-Crystal Data -- 5.4.1 Basics -- 5.4.2 Indexing Error-Free Data -- 5.4.3 Impact of Errors -- 5.4.4 Some Objective Functions -- 5.5 Real-Space Indexing -- 5.5.1 Obtaining Test Vectors -- 5.5.2 Interpretations of t- .4 cdoth- .4 n -- 5.6 Period Detection -- 5.6.1 Domains -- 5.6.2 Test Periods -- 5.6.3 Period Determination Without Binning the Data -- 5.6.4 Folding -- 5.6.5 Correlations with Other Functions -- 5.6.6 One-Dimensional Fourier Transformation -- 5.6.7 Rayleigh Test -- 5.6.8 Lomb-Scargle Periodogram -- 5.6.9 Combining Various Techniques -- 5.7 Difference Vectors -- 5.8 Indexing via Three-Dimensional Fourier Transformation -- 5.9 Clustering in Reciprocal Space -- 5.10 Directions of Zone Axes from Difference Vectors -- 5.11 Constructing a Three-Dimensional Lattice -- 5.12 An Example Indexing Program Ind_X -- 5.12.1 Method -- 5.13 A Bird's Eye View on Ab Initio Indexing -- 5.14 Appendix: Auxiliary Tools -- 5.14.1 Obtaining the Scattering Vector from a Kossel Line -- 5.14.2 Linear Optimization Problem -- 5.14.3 Generation of Integer Triplets -- References -- 6 Ab-Inito Indexing of Laue Patterns -- 6.1 Geometry of Laue Patterns -- 6.1.1 Experimentally Accessible Part of the Reciprocal Space -- 6.2 Gnomonic Projection of Reciprocal Lattice Nodes -- 6.3 Gnomonic Projection of a Cell -- 6.4 Laue Indexing -- 6.4.1 Indexing Software -- 6.4.2 An Approach Referring to Direct Space -- 6.4.3 Getting Zone Axes via Integral Transforms -- 6.4.4 Fitting a Consistent Mesh -- 6.4.5 Indexing Limited to Reciprocal Space -- 6.4.6 Using Sextuplets of Points -- 6.4.7 Testing Superlattices -- 6.4.8 Indices of an Individual Reflection -- 6.4.9 Quality of Solution-Figure of Merit -- 6.5 Indexing of Pink-Beam Diffraction Patterns.
6.5.1 Algorithm for Fitting the Scaling Factor and Orders of Reflections -- References -- 7 Indexing of Powder Diffraction Patterns -- 7.1 Link Between Peaks Positions and Reflection Indices -- 7.2 Ambiguities -- 7.3 Figures of Merit -- 7.4 Indexing Procedures -- 7.4.1 Search in the Continuous Parameter Space -- 7.4.2 Search in the Discrete Index Space -- 7.4.3 Relationships Between Line Positions -- 7.4.4 Metric in Conventional Crystallographic Setting -- 7.4.5 Indexing Based on Complete Pattern -- 7.5 Integrated Software Packages -- References -- 8 Indexing for Crystal Orientation Determination -- 8.1 Orientation Mapping -- 8.2 Orientation via Pattern Indexing -- 8.2.1 Scattering Vectors and Reciprocal Lattice Vectors -- 8.2.2 Vector Magnitudes and Reflection Intensities -- 8.3 Formal Aspects of End-Indexing -- 8.3.1 Basic Relationships -- 8.3.2 Related Solvable Problems -- 8.3.3 Rotations Versus Proper Rotations -- 8.3.4 Computational Context -- 8.4 Spurious Scattering Vectors -- 8.4.1 Accumulation -- 8.5 Accumulation in Discrete Space -- 8.5.1 Triplet Voting -- 8.5.2 Example Implementation -- 8.6 Accumulation in Rotation Space -- 8.6.1 Accumulation at Points of the Rotation Space -- 8.6.2 Accumulation Along Curves in the Space of Rotations -- 8.6.3 Maxima in Rotation Space -- 8.6.4 Other Orientation-Based Algorithms -- 8.7 Testing of Indexing Algorithms -- 8.8 Figures of Merit and Other Issues -- 8.8.1 Three Remarks -- 8.9 Orientation Determination via Direct Pattern Matching -- 8.9.1 Direct Matching Limited by a Detected Reflection -- References -- 9 Indexing of Electron Spot-Type Diffraction Patterns -- 9.1 Conventional Indexing of Zone Axis Patterns -- 9.1.1 180°-Ambiguity -- 9.1.2 Computer-Assisted Conventional Indexing -- 9.2 Automatic Orientation Determination -- 9.2.1 Precession Electron Diffraction.
9.3 Three-Dimensional Ab Initio Indexing -- 9.3.1 Automatic Recording of Tilt Series -- 9.4 Note on Other TEM-Based Patterns -- References -- 10 Example Complications in Indexing -- 10.1 Pseudosymmetry -- 10.2 Indexing of `Multi-lattice' Diffraction Patterns -- 10.2.1 Twins -- 10.2.2 Types of Twins -- 10.2.3 Diffraction Patterns Originating From Twins -- 10.3 Ambiguities in Crystal Orientation Determination -- 10.4 Indexing of Satellite Reflections -- 10.4.1 Sinusoidally Commensurately Modulated One-Dimensional `Crystals' -- 10.4.2 Modulation Propagation Vector -- 10.4.3 Indexing -- 10.4.4 Incommensurately Modulated Structures -- 10.5 Non-Conventional Structure Determination Methods -- 10.5.1 Indexing Grazing-Incidence X-ray Diffraction Data -- 10.5.2 Serial Crystallography -- References -- 11 Multigrain Indexing -- 11.1 Three-Dimensional X-ray Diffraction -- 11.2 X-ray Diffraction Contrast Tomography -- 11.3 Processing of Diffraction Data -- 11.3.1 Location of a Diffraction Spot as a Function of Grain Position -- 11.3.2 Algebraic Reconstruction Technique -- 11.3.3 Friedel Pairs -- 11.3.4 Indexing and Reconstruction -- 11.4 Other Methods of Three-Dimensional Mapping -- 11.4.1 Laboratory X-ray Diffraction Contrast Tomography -- 11.4.2 Differential Aperture X-ray Microscopy -- 11.4.3 Three-Dimensional Orientation Mapping in TEM -- 11.4.4 Three-Dimensional Mapping Using Neutron Diffraction -- References -- 12 An Excursion Beyond Diffraction by Periodic Crystals -- 12.1 Debye Scattering Formula -- 12.2 Single-Particle Diffraction Imaging -- 12.2.1 Phase Problem -- 12.2.2 Iterative Phase Retrieval Algorithms -- 12.2.3 Single-Particle Imaging With XFEL -- 12.3 Indexing of Diffraction Patterns of Helical Structures -- 12.3.1 Helix -- 12.3.2 Helical Structure -- 12.3.3 Structure Factor -- 12.3.4 Selection Rule -- 12.3.5 Single-Wall Tubes.
12.3.6 Intensities in Layer Lines.
Record Nr. UNINA-9910616360003321
Morawiec Adam  
Cham, Switzerland : , : Springer, , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
International Union of Crystallography newsletter
International Union of Crystallography newsletter
Pubbl/distr/stampa New York, NY, : International Union of Crystallography
Disciplina 548
Soggetto topico Crystallography
Soggetto genere / forma Periodicals.
ISSN 1945-0834
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti IUCr newsletter
Record Nr. UNISA-996215295803316
New York, NY, : International Union of Crystallography
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
International Union of Crystallography newsletter
International Union of Crystallography newsletter
Pubbl/distr/stampa New York, NY, : International Union of Crystallography
Disciplina 548
Soggetto topico Crystallography
Soggetto genere / forma Periodicals.
ISSN 1945-0834
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti IUCr newsletter
Record Nr. UNINA-9910136059503321
New York, NY, : International Union of Crystallography
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to Crystallography / Frank Hoffmann
Introduction to Crystallography / Frank Hoffmann
Autore Hoffmann, Frank
Pubbl/distr/stampa Cham, : Springer, 2020
Descrizione fisica X, 309 p. : ill. ; 24 cm
Disciplina 540(Chimica generale)
546(Chimica inorganica)
548(Cristallografia)
549(Mineralogia)
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNICAMPANIA-VAN0244239
Hoffmann, Frank  
Cham, : Springer, 2020
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui