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Contacts to semiconductors : fundamentals and technology / / edited by Leonard J. Brillson
| Contacts to semiconductors : fundamentals and technology / / edited by Leonard J. Brillson |
| Pubbl/distr/stampa | Park Ridge, N.J., : Noyes, c1993 |
| Descrizione fisica | 1 online resource (703 p.) |
| Disciplina | 621.3815/2 |
| Altri autori (Persone) | BrillsonL. J |
| Collana | Materials science and process technology series |
| Soggetto topico |
Electric contacts
Semiconductors - Junctions |
| ISBN |
1-282-01363-7
9786612013638 0-8155-1658-4 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""Preface""; ""Contributors""; ""Contents""; ""1 Ohmic Contacts to GaAs and Other III-V Compounds: Correlation of Microstructure with Electrical Properties""; ""2 Stable and Epitaxial Contacts to III-V Compound Semiconductors""; ""3 Schottky Barriers and Ohmic Contacts to Silicon""; ""4 Insulator/Semiconductor Contacts""; ""5 Interface States""; ""6 Atomic Structure of Metal/GaAs Interfaces: The Role of Defects, Epitaxy, and Morphology""; ""7 Atomic-Scale Chemistry of Metal-Semiconductor Interfaces""
""8 Survey of Recent Developments in the Theoretical Description of the Properties of Semiconductor Interfaces""""9 Atomic-Scale Control of Heterojunction Band Lineups""; ""Index"" |
| Record Nr. | UNINA-9911006671303321 |
| Park Ridge, N.J., : Noyes, c1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University
| An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University |
| Autore | Brillson L. J. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016 |
| Descrizione fisica | 1 online resource (379 p.) |
| Disciplina | 621.381 |
| Soggetto topico |
Electronics - Materials
Surfaces (Technology) - Analysis Spectrum analysis Semiconductors - Materials |
| ISBN |
1-119-02713-6
1-78785-141-9 1-119-02714-4 1-119-02712-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces. |
| Record Nr. | UNINA-9910818236403321 |
Brillson L. J.
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| Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||