Using Imperfect Semiconductor Systems for Unique Identification / / by Jonathan Roberts
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| Autore: |
Roberts Jonathan
|
| Titolo: |
Using Imperfect Semiconductor Systems for Unique Identification / / by Jonathan Roberts
|
| Pubblicazione: | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2017 |
| Edizione: | 1st ed. 2017. |
| Descrizione fisica: | 1 online resource (XV, 123 p. 72 illus., 8 illus. in color.) |
| Disciplina: | 537.622 |
| Soggetto topico: | Semiconductors |
| System safety | |
| Optical materials | |
| Electronics - Materials | |
| Security Science and Technology | |
| Optical and Electronic Materials | |
| Nota di bibliografia: | Includes bibliographical references. |
| Nota di contenuto: | An Introduction to Security Based on Physical Disorder -- An Introduction to Semiconductors and Quantum Confinement -- Sample Preparation and Experimental Techniques -- Unique Identification with Resonant Tunneling Diodes -- Langmuir-Blodgett Deposition of 2D Materials for Unique Identification -- Building Optoelectronic Heterostructures with the Langmuir-Blodgett Technique -- Conclusions and Future Work. |
| Sommario/riassunto: | This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques. Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad. |
| Titolo autorizzato: | Using Imperfect Semiconductor Systems for Unique Identification |
| ISBN: | 3-319-67891-4 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910254594303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
Springer Theses, Recognizing Outstanding Ph.D. Research, . 2190-5053