Strength of Si wafers with microcracks [[electronic resource] ] : a theoretical model / / Przemyslaw (Peter) Rupnowski and Bhushan Sopori

• Pubblicazione: Washington, D.C. : , : United States. Dept. of Energy; Oak Ridge, Tenn. : , : distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, , 2008
• Descrizione fisica: 1 page : color illustrations
• Soggetto topico: Semiconductor wafers - Research; Photovoltaic cells - Research
• Altri autori: SoporiB RupnowskiP
• Note generali: Title from title screen (viewed on July 9, 2012).; "Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California."; "This work was supported by the U.S. Department of Energy under Contract No. DE-AC36-99GO10337 with the National Renewable Energy Laboratory."; "NREL is operated by Midwest Research Institute, Batelle."
• Altri titoli varianti: Strength of Si Wafers with Microcracks
• Titolo autorizzato: Strength of Si wafers with microcracks
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910698697403321
• Lo trovi qui: Univ. Federico II