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Spectroscopic Analysis of Optoelectronic Semiconductors / / by Juan Jimenez, Jens W. Tomm



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Autore: Jimenez Juan Visualizza persona
Titolo: Spectroscopic Analysis of Optoelectronic Semiconductors / / by Juan Jimenez, Jens W. Tomm Visualizza cluster
Pubblicazione: Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016
Edizione: 1st ed. 2016.
Descrizione fisica: 1 online resource (XI, 307 p. 156 illus., 43 illus. in color.)
Disciplina: 530
Soggetto topico: Semiconductors
Lasers
Photonics
Microwaves
Optical engineering
Optics, Lasers, Photonics, Optical Devices
Microwaves, RF and Optical Engineering
Persona (resp. second.): TommJens W
Nota di contenuto: Introduction -- Basics of Optical Spectroscopy -- Raman Spectroscopy -- Photoluminescence Techniques -- Cathodoluminescence -- Photoelectrical Spectroscopy.
Sommario/riassunto: This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.
Titolo autorizzato: Spectroscopic Analysis of Optoelectronic Semiconductors  Visualizza cluster
ISBN: 3-319-42349-5
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910254642103321
Lo trovi qui: Univ. Federico II
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Serie: Springer Series in Optical Sciences, . 0342-4111 ; ; 202