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IEC 62860-1 : 2013(E) IEEE Std. 1620.1-2006 : Test methods for the characterization of organic transistor-based ring oscillators / / Institute of Electrical and Electronics Engineers



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Titolo: IEC 62860-1 : 2013(E) IEEE Std. 1620.1-2006 : Test methods for the characterization of organic transistor-based ring oscillators / / Institute of Electrical and Electronics Engineers Visualizza cluster
Pubblicazione: Piscataway, New Jersey : , : IEEE, , 2013
Descrizione fisica: 1 online resource (26 pages)
Disciplina: 621.381533
Soggetto topico: Oscillators, Electric
Sommario/riassunto: Recommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic circuits, significant measurement errors can be introduced if the electricalcharacterization design-of-experiment is not properly addressed. This standard describes themost common sources of measurement error, particularly for high-impedance electricalmeasurements commonly required for printed and organic ring oscillators. This standard alsogives recommended practices in order to minimize and/or characterize the effect of measurementartifacts and other sources of error encountered while measuring printed and organic ringoscillators.
Altri titoli varianti: IEC 62860-1:2013(E) IEEE Std. 1620.1-2006: IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEC 62860-1
Titolo autorizzato: IEC 62860-1  Visualizza cluster
ISBN: 0-7381-8687-2
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910135404803321
Lo trovi qui: Univ. Federico II
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